Presentation 2008-11-15
Degradation phenomenon of electrical contacts by 3-D oscillating mechanism : Basal characteristic of 3-D oscillating mechanism
Shin-ichi WADA, Keiji KOSHIDA, Taketo SONODA, Hiroto MINEGISHI, Yukiharu KOBAYASHI, Mitsuo KIKUCHI, Hiroaki KUBOTA, Koichiro SAWA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The authors have developed the 3-D oscillation mechanism which expanded 1-D oscillation mechanism, that is to say "hammering oscillating mechanism" and "sliding contact mechanism", into 3-D. And the fundamental characteristics of the mechanism are obtained, such as accelerations, displacements at various frequencies, output wave forms to sinusoidal inputs, and mechanical interferences with the X, Y, and Z-directions of the stage. Experimental results suggested that the mechanism could detect more real degradation phenomenon on contacts by the influences of micro-vibration. However, it is necessary that the mechanism should be improved, for instance, in precision mechanism and in feedback control.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) electrical contact / 3-D oscillating mechanism / magnetostrictive actuator / micro-vibration / contact resistance / hammering oscillation mechanism / sliding contact mechanism
Paper # EMD2008-65
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Conference Information
Committee EMD
Conference Date 2008/11/8(1days)
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Registration To Electromechanical Devices (EMD)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Degradation phenomenon of electrical contacts by 3-D oscillating mechanism : Basal characteristic of 3-D oscillating mechanism
Sub Title (in English)
Keyword(1) electrical contact
Keyword(2) 3-D oscillating mechanism
Keyword(3) magnetostrictive actuator
Keyword(4) micro-vibration
Keyword(5) contact resistance
Keyword(6) hammering oscillation mechanism
Keyword(7) sliding contact mechanism
1st Author's Name Shin-ichi WADA
1st Author's Affiliation R & D Department., TMC System Co., Ltd.()
2nd Author's Name Keiji KOSHIDA
2nd Author's Affiliation R & D Department., TMC System Co., Ltd.
3rd Author's Name Taketo SONODA
3rd Author's Affiliation R & D Department., TMC System Co., Ltd.
4th Author's Name Hiroto MINEGISHI
4th Author's Affiliation R & D Department., TMC System Co., Ltd.
5th Author's Name Yukiharu KOBAYASHI
5th Author's Affiliation R & D Department., TMC System Co., Ltd.
6th Author's Name Mitsuo KIKUCHI
6th Author's Affiliation R & D Department., TMC System Co., Ltd.
7th Author's Name Hiroaki KUBOTA
7th Author's Affiliation R & D Department., TMC System Co., Ltd.
8th Author's Name Koichiro SAWA
8th Author's Affiliation K-201,Shin-Kawasaki Town Campus, Keio University
Date 2008-11-15
Paper # EMD2008-65
Volume (vol) vol.108
Number (no) 296
Page pp.pp.-
#Pages 4
Date of Issue