Presentation 2008-11-19
Leakage Power Reduction Method for Dual-Rail Four-Phase Asynchronous Circuits Using Multi-Vth Transistors
Koei TAKADA, Masashi IMAI, Hiroshi NAKAMURA, Takashi NANYA,
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Abstract(in English) Dual-rail four-phase asynchronous circuits are well-known for their benefits in terms of delay variation tolerance. On the other hand, dual-rail circuits need to reduce their leakage power, since dual-rail asynchronous logic is often known to be larger than its equivalent single-rail counter-part, and thus its leakage power is also larger. In this paper, we propose leakage power reduction method for dual-rail four-phase asynchronous circuits using multi-Vth transistors.
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Keyword(in English) Delay Variation / Leakage Power / Dual-rail Four-Phase Asynchronous Circuit / Multi-Vth Transistor
Paper # VLD2008-90,DC2008-58
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Committee VLD
Conference Date 2008/11/10(1days)
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Registration To VLSI Design Technologies (VLD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Leakage Power Reduction Method for Dual-Rail Four-Phase Asynchronous Circuits Using Multi-Vth Transistors
Sub Title (in English)
Keyword(1) Delay Variation
Keyword(2) Leakage Power
Keyword(3) Dual-rail Four-Phase Asynchronous Circuit
Keyword(4) Multi-Vth Transistor
1st Author's Name Koei TAKADA
1st Author's Affiliation Reserch Center for Advanced Science and Technology, The University of Tokyo()
2nd Author's Name Masashi IMAI
2nd Author's Affiliation Reserch Center for Advanced Science and Technology, The University of Tokyo
3rd Author's Name Hiroshi NAKAMURA
3rd Author's Affiliation Reserch Center for Advanced Science and Technology, The University of Tokyo
4th Author's Name Takashi NANYA
4th Author's Affiliation Reserch Center for Advanced Science and Technology, The University of Tokyo
Date 2008-11-19
Paper # VLD2008-90,DC2008-58
Volume (vol) vol.108
Number (no) 298
Page pp.pp.-
#Pages 6
Date of Issue