| Presentation | 2008-11-18 A Test Point Insertion Method for Test Data Reduction Based on Necessary Assignment Kazuko HIRAMOTO, Yuki YOSHIKAWA, Hideyuki ICHIHARA, Tomoo INOUE, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this work, we discuss a method for reducing test data by test point insertion. Focusing on the fact that test points can resolve conflicts among faults that require different assignments to identical signal lines for detection, we propose a measure of test points for the ability to resolve such fault conflict based on necessary assignments for fault detection. We also present an algorithm for inserting test points in scan design based on the proposed test point measure. The analytical results with experiments show that, there exists an optimal number of test points which minimizes the amount of test data (or the test application time). Experimental results show that our test point insertion method is effective in reducing the test data volume, not just the number of test patterns, with a few test points, and the proposed test point measure is more effective in reducing the test patterns than the mesure reported in previous works. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Test point / test data reduction / implication / necessary assignment / fault conflict |
| Paper # | VLD2008-80,DC2008-48 |
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| Conference Information | |
| Committee | VLD |
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| Conference Date | 2008/11/10(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | VLSI Design Technologies (VLD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Test Point Insertion Method for Test Data Reduction Based on Necessary Assignment |
| Sub Title (in English) | |
| Keyword(1) | Test point |
| Keyword(2) | test data reduction |
| Keyword(3) | implication |
| Keyword(4) | necessary assignment |
| Keyword(5) | fault conflict |
| 1st Author's Name | Kazuko HIRAMOTO |
| 1st Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University() |
| 2nd Author's Name | Yuki YOSHIKAWA |
| 2nd Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| 3rd Author's Name | Hideyuki ICHIHARA |
| 3rd Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| 4th Author's Name | Tomoo INOUE |
| 4th Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| Date | 2008-11-18 |
| Paper # | VLD2008-80,DC2008-48 |
| Volume (vol) | vol.108 |
| Number (no) | 298 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |