Presentation 2008-11-28
Normally-off mode AlGaN/GaN HEMTs with p-InGaN Cap Layer
Xu LI, Masahito KUROUCHI, Shigeru KISHIMOTO, Takashi MIZUTANI, Fumihiko NAKAMURA,
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Abstract(in English) We have fabricated AlGaN/GaN HEMTs with a thin p-InGaN cap layer and measured I-V characteristics of the devices. For the activation of M_g in p-InGaN cap layer, annealing at 800℃ was relatively good. Compared to AlGaN/GaN HEMTs without InGaN cap layer and i-InGaN cap HEMTs, the threshold voltage of p-InGaN cap (800℃) HEMTs shifted about 2.2V, 1.3V respectively and was 1.1V. The complete normally-off operation of AlGaN/GaN HEMTs has been realized. For p-InGaN cap (800℃) HEMTs, a higher g_ of 146mS/mm than that of HEMTs without InGaN cap of 128mS/mm was obtained.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) AlGaN/GaN HEMT / p-InGaN cap / activation annealing / normally-off / gate leakage current
Paper # ED2008-177,CPM2008-126,LQE2008-121
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Committee ED
Conference Date 2008/11/20(1days)
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Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Normally-off mode AlGaN/GaN HEMTs with p-InGaN Cap Layer
Sub Title (in English)
Keyword(1) AlGaN/GaN HEMT
Keyword(2) p-InGaN cap
Keyword(3) activation annealing
Keyword(4) normally-off
Keyword(5) gate leakage current
1st Author's Name Xu LI
1st Author's Affiliation Quantum Engineering, Graduate School of Engineering, Nagoya University()
2nd Author's Name Masahito KUROUCHI
2nd Author's Affiliation Quantum Engineering, Graduate School of Engineering, Nagoya University
3rd Author's Name Shigeru KISHIMOTO
3rd Author's Affiliation Quantum Engineering, Graduate School of Engineering, Nagoya University
4th Author's Name Takashi MIZUTANI
4th Author's Affiliation Quantum Engineering, Graduate School of Engineering, Nagoya University
5th Author's Name Fumihiko NAKAMURA
5th Author's Affiliation POWDEC K.K.
Date 2008-11-28
Paper # ED2008-177,CPM2008-126,LQE2008-121
Volume (vol) vol.108
Number (no) 321
Page pp.pp.-
#Pages 5
Date of Issue