Presentation | 2008-11-28 Normally-off mode AlGaN/GaN HEMTs with p-InGaN Cap Layer Xu LI, Masahito KUROUCHI, Shigeru KISHIMOTO, Takashi MIZUTANI, Fumihiko NAKAMURA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We have fabricated AlGaN/GaN HEMTs with a thin p-InGaN cap layer and measured I-V characteristics of the devices. For the activation of M_g in p-InGaN cap layer, annealing at 800℃ was relatively good. Compared to AlGaN/GaN HEMTs without InGaN cap layer and i-InGaN cap HEMTs, the threshold voltage of p-InGaN cap (800℃) HEMTs shifted about 2.2V, 1.3V respectively and was 1.1V. The complete normally-off operation of AlGaN/GaN HEMTs has been realized. For p-InGaN cap (800℃) HEMTs, a higher g_ |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | AlGaN/GaN HEMT / p-InGaN cap / activation annealing / normally-off / gate leakage current |
Paper # | ED2008-177,CPM2008-126,LQE2008-121 |
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Committee | ED |
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Conference Date | 2008/11/20(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Normally-off mode AlGaN/GaN HEMTs with p-InGaN Cap Layer |
Sub Title (in English) | |
Keyword(1) | AlGaN/GaN HEMT |
Keyword(2) | p-InGaN cap |
Keyword(3) | activation annealing |
Keyword(4) | normally-off |
Keyword(5) | gate leakage current |
1st Author's Name | Xu LI |
1st Author's Affiliation | Quantum Engineering, Graduate School of Engineering, Nagoya University() |
2nd Author's Name | Masahito KUROUCHI |
2nd Author's Affiliation | Quantum Engineering, Graduate School of Engineering, Nagoya University |
3rd Author's Name | Shigeru KISHIMOTO |
3rd Author's Affiliation | Quantum Engineering, Graduate School of Engineering, Nagoya University |
4th Author's Name | Takashi MIZUTANI |
4th Author's Affiliation | Quantum Engineering, Graduate School of Engineering, Nagoya University |
5th Author's Name | Fumihiko NAKAMURA |
5th Author's Affiliation | POWDEC K.K. |
Date | 2008-11-28 |
Paper # | ED2008-177,CPM2008-126,LQE2008-121 |
Volume (vol) | vol.108 |
Number (no) | 321 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |