Presentation 2008-11-28
Optimum Design of AlGaN/GaN HEMTs with a Field Plate
Ryosuke Sakai, Tomotaka Okai, Kenji Shiojima, Masaaki Kuzuhara,
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Abstract(in English) We have analyzed the electric field distribution for AlGaN/GaN HEMTs with various types of graded field plates using an ensemble Monte Carlo 2D device simulation. It was found that the graded field plate, where the dielectric film thickness under the field plate gradually increases along gate to drain direction, was effective to minimize the peak electric field strength in the channel layer. Empirical equations expressing the breakdown voltage as functions of device parameters have been derived. We have also analyzed the breakdown characteristics, taking breakdown fields in semiconductor materials as well as those in dielectric materials into account. Simulation results show that a dielectric film with a wide bandgap and a high dielectric constant, such as Al_2O_3, is desirable to ensure excellent breakdown characteristics. The highest breakdown voltage of around 3000V is predicted for a device with a graded field plate length of 5μm.
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Keyword(in English) field plate / GaN / HEMT / breakdown voltage / Monte Carlo simulation
Paper # ED2008-174,CPM2008-123,LQE2008-118
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Committee ED
Conference Date 2008/11/20(1days)
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Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Optimum Design of AlGaN/GaN HEMTs with a Field Plate
Sub Title (in English)
Keyword(1) field plate
Keyword(2) GaN
Keyword(3) HEMT
Keyword(4) breakdown voltage
Keyword(5) Monte Carlo simulation
1st Author's Name Ryosuke Sakai
1st Author's Affiliation Graduate School of Engineering, University of Fukui()
2nd Author's Name Tomotaka Okai
2nd Author's Affiliation Graduate School of Engineering, University of Fukui
3rd Author's Name Kenji Shiojima
3rd Author's Affiliation Graduate School of Engineering, University of Fukui
4th Author's Name Masaaki Kuzuhara
4th Author's Affiliation Graduate School of Engineering, University of Fukui
Date 2008-11-28
Paper # ED2008-174,CPM2008-123,LQE2008-118
Volume (vol) vol.108
Number (no) 321
Page pp.pp.-
#Pages 6
Date of Issue