Presentation 2008-11-28
Two-Dimensional Analysis of Field-Plate Effects on Buffer-Related Lag Phenomena and Current Collapse in AlGaN/GaN HEMTs
Atsushi NAKAJIMA, Keiichi ITAGAKI, Kazushige HORIO,
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Abstract(in English) Two-dimensional transient analyses of field-plate AlGaN/GaN HEMTs are performed in which a deep donor and a deep acceptor are considered in a semi-insulating buffer layer, and quasi-pulsed current-voltage curves are derived from them. It is studied how the existence of field plate affects buffer-related drain lag, gate lag and current collapse. It is shown that the drain lag is reduced by introducing a field plate, because electron injection into the buffer layer is weakened by it, and the trapping effects are reduced. It is also shown that the current collapse and gate lag are reduced in the field-plate structures. The dependence on SiN passivation layer thickness is also studied, suggesting that there is an optimum thickness of SiN layer to minimize the buffer-related current collapse and drain lag in AlGaN/GaN HEMTs.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) GaN / HEMT / Field Plate / Current Collapse / Drain Lag / Trap / Two-Dimensional Numerical Analysis
Paper # ED2008-173,CPM2008-122,LQE2008-117
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Committee ED
Conference Date 2008/11/20(1days)
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Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Two-Dimensional Analysis of Field-Plate Effects on Buffer-Related Lag Phenomena and Current Collapse in AlGaN/GaN HEMTs
Sub Title (in English)
Keyword(1) GaN
Keyword(2) HEMT
Keyword(3) Field Plate
Keyword(4) Current Collapse
Keyword(5) Drain Lag
Keyword(6) Trap
Keyword(7) Two-Dimensional Numerical Analysis
1st Author's Name Atsushi NAKAJIMA
1st Author's Affiliation Faculty of Systems Engineering, Shibaura Institute of Technology()
2nd Author's Name Keiichi ITAGAKI
2nd Author's Affiliation Faculty of Systems Engineering, Shibaura Institute of Technology
3rd Author's Name Kazushige HORIO
3rd Author's Affiliation Faculty of Systems Engineering, Shibaura Institute of Technology
Date 2008-11-28
Paper # ED2008-173,CPM2008-122,LQE2008-117
Volume (vol) vol.108
Number (no) 321
Page pp.pp.-
#Pages 5
Date of Issue