Presentation 2008-11-18
Thermal design and on-die thermal sensing in the SX supercomputers
Mikihiro KAJITA, Eisuke SANEYOSHI, Koichi NOSE, Masayuki MIZUNO,
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Abstract(in English) NEC has developed supercomputers "SX" using the leading-edge LSI technologies. In the latest microprocessors, CMOS transistors are integrated over die with high density, which may result in an enormous increase in power density. To prevent this critical increase in power consumption, we have proposed a thermal sensor based on transistor off-leakage current, that allows measurement error of less than 3.1℃ even at high temperature. In this paper, we present our thermal sensor and our thermal design using this sensor.
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Keyword(in English) supercompurter / thermal design / on-die thermal sensing / off leakage current
Paper # CPM2008-91,ICD2008-90
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Committee CPM
Conference Date 2008/11/11(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Thermal design and on-die thermal sensing in the SX supercomputers
Sub Title (in English)
Keyword(1) supercompurter
Keyword(2) thermal design
Keyword(3) on-die thermal sensing
Keyword(4) off leakage current
1st Author's Name Mikihiro KAJITA
1st Author's Affiliation NEC Corporation()
2nd Author's Name Eisuke SANEYOSHI
2nd Author's Affiliation NEC Corporation
3rd Author's Name Koichi NOSE
3rd Author's Affiliation NEC Corporation
4th Author's Name Masayuki MIZUNO
4th Author's Affiliation NEC Corporation
Date 2008-11-18
Paper # CPM2008-91,ICD2008-90
Volume (vol) vol.108
Number (no) 301
Page pp.pp.-
#Pages 6
Date of Issue