Presentation | 2008-11-18 Thermal design and on-die thermal sensing in the SX supercomputers Mikihiro KAJITA, Eisuke SANEYOSHI, Koichi NOSE, Masayuki MIZUNO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | NEC has developed supercomputers "SX" using the leading-edge LSI technologies. In the latest microprocessors, CMOS transistors are integrated over die with high density, which may result in an enormous increase in power density. To prevent this critical increase in power consumption, we have proposed a thermal sensor based on transistor off-leakage current, that allows measurement error of less than 3.1℃ even at high temperature. In this paper, we present our thermal sensor and our thermal design using this sensor. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | supercompurter / thermal design / on-die thermal sensing / off leakage current |
Paper # | CPM2008-91,ICD2008-90 |
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Conference Information | |
Committee | CPM |
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Conference Date | 2008/11/11(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Component Parts and Materials (CPM) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Thermal design and on-die thermal sensing in the SX supercomputers |
Sub Title (in English) | |
Keyword(1) | supercompurter |
Keyword(2) | thermal design |
Keyword(3) | on-die thermal sensing |
Keyword(4) | off leakage current |
1st Author's Name | Mikihiro KAJITA |
1st Author's Affiliation | NEC Corporation() |
2nd Author's Name | Eisuke SANEYOSHI |
2nd Author's Affiliation | NEC Corporation |
3rd Author's Name | Koichi NOSE |
3rd Author's Affiliation | NEC Corporation |
4th Author's Name | Masayuki MIZUNO |
4th Author's Affiliation | NEC Corporation |
Date | 2008-11-18 |
Paper # | CPM2008-91,ICD2008-90 |
Volume (vol) | vol.108 |
Number (no) | 301 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |