Presentation | 2008-10-17 Contact Resistance Characteristics of Soft Metal Contacts such as Sn, Al, Sn Terutaka Tamai, Sigeru Sawada, Yasuhiro Hattori, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Soft metal group such as Sn, Al and In is widely applied to connections, junctions and contacts. Since surfaces of the metals are usually covered with its oxide films, corrosion resistance property appears. It is difficult to obtain low contact resistance without mechanical break-down of the oxide film. Therefore, contact mechanisms are complex and are not clarified. In the present study, to clarify the contact mechanism of the soft metal group contacts more in detail, the contact resistance characteristics for changes of contact load were measured under lower contact load region. Obtained contact traces in these examinations were observed by optically and SEM. As results, it was found that decrease in the contact resistance strongly depended on a deformation of piling up of a periphery of the contact trace and occurrence of adhesions which can not be explained by the deformation theory widely accepted. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Sn, Al and In soft group contacts / contact resistance / contact load / contact trace / connector |
Paper # | EMD2008-62 |
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Conference Information | |
Committee | EMD |
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Conference Date | 2008/10/10(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Electromechanical Devices (EMD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Contact Resistance Characteristics of Soft Metal Contacts such as Sn, Al, Sn |
Sub Title (in English) | |
Keyword(1) | Sn, Al and In soft group contacts |
Keyword(2) | contact resistance |
Keyword(3) | contact load |
Keyword(4) | contact trace |
Keyword(5) | connector |
1st Author's Name | Terutaka Tamai |
1st Author's Affiliation | Mie University, Graduate School of Engineering, Laboratory of Vehicle Network Technology() |
2nd Author's Name | Sigeru Sawada |
2nd Author's Affiliation | Mie University, Graduate School of Engineering, Laboratory of Vehicle Network Technology |
3rd Author's Name | Yasuhiro Hattori |
3rd Author's Affiliation | AutoNetworks, Ltd. |
Date | 2008-10-17 |
Paper # | EMD2008-62 |
Volume (vol) | vol.108 |
Number (no) | 246 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |