Presentation 2008-10-17
Contact Resistance Characteristics of Soft Metal Contacts such as Sn, Al, Sn
Terutaka Tamai, Sigeru Sawada, Yasuhiro Hattori,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) Soft metal group such as Sn, Al and In is widely applied to connections, junctions and contacts. Since surfaces of the metals are usually covered with its oxide films, corrosion resistance property appears. It is difficult to obtain low contact resistance without mechanical break-down of the oxide film. Therefore, contact mechanisms are complex and are not clarified. In the present study, to clarify the contact mechanism of the soft metal group contacts more in detail, the contact resistance characteristics for changes of contact load were measured under lower contact load region. Obtained contact traces in these examinations were observed by optically and SEM. As results, it was found that decrease in the contact resistance strongly depended on a deformation of piling up of a periphery of the contact trace and occurrence of adhesions which can not be explained by the deformation theory widely accepted.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Sn, Al and In soft group contacts / contact resistance / contact load / contact trace / connector
Paper # EMD2008-62
Date of Issue

Conference Information
Committee EMD
Conference Date 2008/10/10(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Electromechanical Devices (EMD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Contact Resistance Characteristics of Soft Metal Contacts such as Sn, Al, Sn
Sub Title (in English)
Keyword(1) Sn, Al and In soft group contacts
Keyword(2) contact resistance
Keyword(3) contact load
Keyword(4) contact trace
Keyword(5) connector
1st Author's Name Terutaka Tamai
1st Author's Affiliation Mie University, Graduate School of Engineering, Laboratory of Vehicle Network Technology()
2nd Author's Name Sigeru Sawada
2nd Author's Affiliation Mie University, Graduate School of Engineering, Laboratory of Vehicle Network Technology
3rd Author's Name Yasuhiro Hattori
3rd Author's Affiliation AutoNetworks, Ltd.
Date 2008-10-17
Paper # EMD2008-62
Volume (vol) vol.108
Number (no) 246
Page pp.pp.-
#Pages 6
Date of Issue