Presentation 2008-10-30
Mutual Inductance between Two Superconducting Lines Parallely-Placed in Nb Integrated Circuits
Akio KAWAI, Ryuta KASHIWA, Masataka MORIYA, Tadayuki KOBAYASHI, Yoshinao MIZUGAKI,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We evaluate mutual inductance between two parallely-placed strip lines by means of both experiments and numerical calculation. Test circuits fabricated using the SRL Nb standard process was used to measure the mutual inductances, whereas a three-dimensional inductance extraction program FastHenry was employed for calculation. Three types of strip line structures were examined: two microstrip lines without an upper ground plane (GP), two strip lines with a floating upper GP, and two strip lines with an upper GP connected to a lower GP. Each strip line structure has different dependence of mutual inductance on the line center distance, which is explained by using current and magnetic field distribution in each structure. We have found that the mutual inductance in the second line structure decreases with increasing width of the upper GP, and that the mutual inductance in the third line structure becomes its minimum when the contacts between the upper and lower GPs are placed close to the line edges.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Meissner effect / niobium / FastHenry / SQUID / stripline / mutual inductance
Paper # SCE2008-26
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Conference Information
Committee SCE
Conference Date 2008/10/23(1days)
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Paper Information
Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Mutual Inductance between Two Superconducting Lines Parallely-Placed in Nb Integrated Circuits
Sub Title (in English)
Keyword(1) Meissner effect
Keyword(2) niobium
Keyword(3) FastHenry
Keyword(4) SQUID
Keyword(5) stripline
Keyword(6) mutual inductance
1st Author's Name Akio KAWAI
1st Author's Affiliation The University of Electro-Communications()
2nd Author's Name Ryuta KASHIWA
2nd Author's Affiliation The University of Electro-Communications
3rd Author's Name Masataka MORIYA
3rd Author's Affiliation The University of Electro-Communications
4th Author's Name Tadayuki KOBAYASHI
4th Author's Affiliation The University of Electro-Communications
5th Author's Name Yoshinao MIZUGAKI
5th Author's Affiliation The University of Electro-Communications
Date 2008-10-30
Paper # SCE2008-26
Volume (vol) vol.108
Number (no) 268
Page pp.pp.-
#Pages 6
Date of Issue