Presentation 2008-09-26
A measurement of retention time of a dynamic optically reconfigurable gate array with large gates
Daisaku SETO, Minoru WATANABE,
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Abstract(in English) Recently, various fast reconfigurable devices have been developed. We have been developing a type of such fast reconfigurable devices, Optically Reconfigurable Gate Arrays (ORGAs) that can optically be reconfigured in a perfectly parallel. In this device, large gates can be achieved by exploiting the large storage capacity of a holographic memory. However, the instantaneous performance of ORGAs depends on the actual gate count of its VLSI part. So, we have fabricated the world's largest gate count dynamic optically reconfigurable gate array VLSI (DORGA-VLSI) using dynamic architecture that uses photodiode as memory. This paper presents an estimation result of retention time of the DORGA-VLSI chip.
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Keyword(in English) FPGAs / Optically Reconfigurable Gate Arrays (ORGAs) / Optical bus / Holographic memories
Paper # RECONF2008-31
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Committee RECONF
Conference Date 2008/9/18(1days)
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Registration To Reconfigurable Systems (RECONF)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A measurement of retention time of a dynamic optically reconfigurable gate array with large gates
Sub Title (in English)
Keyword(1) FPGAs
Keyword(2) Optically Reconfigurable Gate Arrays (ORGAs)
Keyword(3) Optical bus
Keyword(4) Holographic memories
1st Author's Name Daisaku SETO
1st Author's Affiliation Department of Electrical and Electronic Engineering, Graduate School of Engineering, Shizuoka University()
2nd Author's Name Minoru WATANABE
2nd Author's Affiliation Department of Electrical and Electronic Engineering, Faculty of Engineering, Shizuoka University
Date 2008-09-26
Paper # RECONF2008-31
Volume (vol) vol.108
Number (no) 220
Page pp.pp.-
#Pages 5
Date of Issue