Presentation 2008-08-29
A study on channel model for millimeter wave WPAN
Katsuyoshi SATO, Shuzo KATO, Hiroshi HARADA, Hiroyuki NAKASE, Hirokazu Sawada,
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Abstract(in English) We have developed a model called the triple S-V: Shoji-Sawada-Saleh-Valenzuela (TSV) model based on the Saleh-Valenzuela (SV) model; we employed it as a channel model for evaluating the proposed PHY layer schemes in IEEE802.15.3c (which provides the standards for millimeter wave Wireless PANs (WPANs)). This model tends to overestimate the value of delay spread in the environment, thereby leading to dominant reflection wave. However, because it is expected that a strong reflected wave can be regarded as a direct wave, delay spread can become small in indoor environments. By using wide beam antennas, we measured double directional propagation characteristics to show that the propagation characteristics of the reflection wave are dominant in actual residential environments. It is shown that the delay spread could be decreased to 1ns or less even when the direct wave could not be received with sufficient power.
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Keyword(in English) Millimeter wave / Channel model / WPAN / Propagation characteristics
Paper # RCS2008-100
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Conference Information
Committee RCS
Conference Date 2008/8/20(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A study on channel model for millimeter wave WPAN
Sub Title (in English)
Keyword(1) Millimeter wave
Keyword(2) Channel model
Keyword(3) WPAN
Keyword(4) Propagation characteristics
1st Author's Name Katsuyoshi SATO
1st Author's Affiliation National Institute of Information and Communications technology()
2nd Author's Name Shuzo KATO
2nd Author's Affiliation National Institute of Information and Communications technology
3rd Author's Name Hiroshi HARADA
3rd Author's Affiliation National Institute of Information and Communications technology
4th Author's Name Hiroyuki NAKASE
4th Author's Affiliation Tohoku University
5th Author's Name Hirokazu Sawada
5th Author's Affiliation Tohoku Institute of Technology
Date 2008-08-29
Paper # RCS2008-100
Volume (vol) vol.108
Number (no) 188
Page pp.pp.-
#Pages 6
Date of Issue