| Presentation | 2008/7/29 A Method of Reducing Access Time for Disk Array Shugo OGAWA, Yoshihiro HASEBE, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The ratio of disk access time in processing time of computer system increase recently. The number of consolidated storage systems which have more than one parallel workload also increase. High performance I/O is often required in those consolidated storage systems. For reducing disk access time, RAID disk arrays are used for improving access performance as well as avoiding data loss due to disk failure. However, RAID does not reduce seek time due to random accesses. In this paper, we propose seek time reduction method using data redundancy of disk array. We evaluated the effect of our method on reducing seek time with simulating RAID1 disk array. Our method reduce average TAT (Turn Around Time) on environment with continuous ramdom read access commands. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | RAID / seek time / random access / scheduling / average TAT |
| Paper # | CPSY2008-19 |
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| Conference Information | |
| Committee | CPSY |
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| Conference Date | 2008/7/29(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Computer Systems (CPSY) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Method of Reducing Access Time for Disk Array |
| Sub Title (in English) | |
| Keyword(1) | RAID |
| Keyword(2) | seek time |
| Keyword(3) | random access |
| Keyword(4) | scheduling |
| Keyword(5) | average TAT |
| 1st Author's Name | Shugo OGAWA |
| 1st Author's Affiliation | System Platforms Research Laboratories, NEC Corporation() |
| 2nd Author's Name | Yoshihiro HASEBE |
| 2nd Author's Affiliation | System Platforms Research Laboratories, NEC Corporation |
| Date | 2008/7/29 |
| Paper # | CPSY2008-19 |
| Volume (vol) | vol.108 |
| Number (no) | 180 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |