Presentation | 2008-08-29 Fiber-Optic Brillouin Distributed Discrimination of Strain and Temperature Using Correlation-Based Continuous-Wave Technique Weiwen Zou, Zuyuan He, Kazuo Hotate, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | This paper presents the first successful demonstration of distributed discrimination of strain and temperature with cm-order spatial resolution. Local changes of the Brillouin frequency shift and the birefringence-determined frequency deviation induced by strain and temperature in a Panda-type polarization-maintaining fiber are simultaneously measured for the discrimination. The distributed discriminative errors are estimated as low as 12 micro-strains for strain and 0.3 Celsius degrees for temperature, respectively. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | stimulated Brillouin scattering / fiber-optic sensors / discriminative measurement / strain / temperature / dynamic grating / polarization maintaining fiber |
Paper # | OFT2008-28 |
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Committee | OFT |
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Conference Date | 2008/8/21(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Optical Fiber Technology (OFT) |
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Language | ENG |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Fiber-Optic Brillouin Distributed Discrimination of Strain and Temperature Using Correlation-Based Continuous-Wave Technique |
Sub Title (in English) | |
Keyword(1) | stimulated Brillouin scattering |
Keyword(2) | fiber-optic sensors |
Keyword(3) | discriminative measurement |
Keyword(4) | strain |
Keyword(5) | temperature |
Keyword(6) | dynamic grating |
Keyword(7) | polarization maintaining fiber |
1st Author's Name | Weiwen Zou |
1st Author's Affiliation | Department of Electronic Engineering, The University of Tokyo() |
2nd Author's Name | Zuyuan He |
2nd Author's Affiliation | Department of Electronic Engineering, The University of Tokyo |
3rd Author's Name | Kazuo Hotate |
3rd Author's Affiliation | Department of Electronic Engineering, The University of Tokyo |
Date | 2008-08-29 |
Paper # | OFT2008-28 |
Volume (vol) | vol.108 |
Number (no) | 190 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |