| Presentation | 2008/7/29 Hardware Faults Simulation in a Virtualization Environment for System Tests of High-Availability Cluster System Shunsuke KOKUBU, Yoshiaki KATAYAMA, Tsuyoshi HIGUCHI, Toshio MATSUMOTO, Toshiharu AIURA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Recently, the case where servers are consolidated by a virtualization technology increases with the purpose of effective utilization of server resources and cost saving. However, it is difficult to examine a system switching operation that assumes a variety of hardware failures in HA (High-Availability) cluster system with virtualization environment. In this paper, we propose Virtual Fault Management System to solve this problem. We present the system design and the effectiveness evaluation by applying the system tests of HA cluster system. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Virtualization / Faults Simulation / Cluster / Availability / Reliability / System Tests |
| Paper # | DC2008-19 |
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| Committee | DC |
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| Conference Date | 2008/7/29(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Hardware Faults Simulation in a Virtualization Environment for System Tests of High-Availability Cluster System |
| Sub Title (in English) | |
| Keyword(1) | Virtualization |
| Keyword(2) | Faults Simulation |
| Keyword(3) | Cluster |
| Keyword(4) | Availability |
| Keyword(5) | Reliability |
| Keyword(6) | System Tests |
| 1st Author's Name | Shunsuke KOKUBU |
| 1st Author's Affiliation | Mitsubishi Electric Corporation, Information Technology R & D Center() |
| 2nd Author's Name | Yoshiaki KATAYAMA |
| 2nd Author's Affiliation | Mitsubishi Electric Corporation, Information Technology R & D Center |
| 3rd Author's Name | Tsuyoshi HIGUCHI |
| 3rd Author's Affiliation | Mitsubishi Electric Corporation, Information Technology R & D Center |
| 4th Author's Name | Toshio MATSUMOTO |
| 4th Author's Affiliation | Mitsubishi Electric Corporation, Information Technology R & D Center |
| 5th Author's Name | Toshiharu AIURA |
| 5th Author's Affiliation | Mitsubishi Electric Corporation, Information Technology R & D Center |
| Date | 2008/7/29 |
| Paper # | DC2008-19 |
| Volume (vol) | vol.108 |
| Number (no) | 181 |
| Page | pp.pp.- |
| #Pages | 7 |
| Date of Issue | |