| Presentation | 2008-07-17 One-end Two-port Measurement Technique for Four-port S-parameters Akira MATSUDA, Osami WADA, Umberto PAOLETTI, Takashi HISAKADO, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | One way of evaluating circuit characteristics is to measure the scattering (S) parameters with a vector network analyzer. Since it is difficult to set an equipotential ground on high-density boards, the authors propose a new procedure for four-port circuit measurement, the one-end two-port measurement technique, which does not require an equipotential ground. In order to use the one-end two-port measurement technique,the termination condition at two ports on one end is changed with open, short, and 50-ohm matching, and two-port S-parameters are measured at two ports on the other end. Four-port S-parameters are calculated from these results. Two pairs of expressions are derived using this method. When expressions are selected to see the effects of termination condition, the S-parameters are correctly obtained, except for the parameters between the far-end ports where the termination condition is changed. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | measurement technique / s-parameters / four-port circuit / one-end measurement / terminal condition |
| Paper # | EMCJ2008-31 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2008/7/10(1days) |
| Place (in Japanese) | (See Japanese page) |
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| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | One-end Two-port Measurement Technique for Four-port S-parameters |
| Sub Title (in English) | |
| Keyword(1) | measurement technique |
| Keyword(2) | s-parameters |
| Keyword(3) | four-port circuit |
| Keyword(4) | one-end measurement |
| Keyword(5) | terminal condition |
| 1st Author's Name | Akira MATSUDA |
| 1st Author's Affiliation | Guraduate School of Engineering, Kyoto University() |
| 2nd Author's Name | Osami WADA |
| 2nd Author's Affiliation | Guraduate School of Engineering, Kyoto University |
| 3rd Author's Name | Umberto PAOLETTI |
| 3rd Author's Affiliation | Guraduate School of Engineering, Kyoto University |
| 4th Author's Name | Takashi HISAKADO |
| 4th Author's Affiliation | Guraduate School of Engineering, Kyoto University |
| Date | 2008-07-17 |
| Paper # | EMCJ2008-31 |
| Volume (vol) | vol.108 |
| Number (no) | 132 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |