Presentation 2008-07-11
Electrical Properties of Highly Crystallized Ge : H Thin Films Grown from VHF Inductively-Coupled Plasma of H_2-diluted GeH_4(Session9A: Silicon Devices IV)
Hirotaka Kaku, Katsunori Makihara, Mitsuhisa Ikeda, Seiichiro Higashi, Seiichi Miyazaki,
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Abstract(in English) Formation of highly crystallized Ge films on quartz substrate from VHF-ICP of GeH_4 and electrical properties of the films have been investigated. From the Hall measurements, we found that the films show p-type conduction and that carrier concentrations for the films of 92 and 98% in the crystallinity are 2.9×10^<19> and 5.7×10^<18>cm^<-3>, respectively. In addition, we observed a carrier mobility of 22cm^2/Vs for the film with 98% crystallinity, which is ~2 times higher compared to 12cm^2/Vs of 92% case. This result suggests that defects in the films play a role on carrier type and transport properties.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Ge / VHF / carrier concentration / defect
Paper # ED2008-90,SDM2008-109
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Committee ED
Conference Date 2008/7/2(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Electrical Properties of Highly Crystallized Ge : H Thin Films Grown from VHF Inductively-Coupled Plasma of H_2-diluted GeH_4(Session9A: Silicon Devices IV)
Sub Title (in English)
Keyword(1) Ge
Keyword(2) VHF
Keyword(3) carrier concentration
Keyword(4) defect
1st Author's Name Hirotaka Kaku
1st Author's Affiliation Graduate School of Advanced Sciences of Matter, Hiroshima University()
2nd Author's Name Katsunori Makihara
2nd Author's Affiliation Graduate School of Advanced Sciences of Matter, Hiroshima University
3rd Author's Name Mitsuhisa Ikeda
3rd Author's Affiliation Graduate School of Advanced Sciences of Matter, Hiroshima University
4th Author's Name Seiichiro Higashi
4th Author's Affiliation Graduate School of Advanced Sciences of Matter, Hiroshima University
5th Author's Name Seiichi Miyazaki
5th Author's Affiliation Graduate School of Advanced Sciences of Matter, Hiroshima University
Date 2008-07-11
Paper # ED2008-90,SDM2008-109
Volume (vol) vol.108
Number (no) 121
Page pp.pp.-
#Pages 4
Date of Issue