Presentation 2008-07-11
Impact of 180nm Current Controlled MCML for Realizing Stable Circuit Operations under Threshold Voltage Fluctuations(Session8A: Si Devices III)
Masashi KAMIYANAGI, Yuto NORIFUSA, Tetsuo ENDOH,
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Abstract(in English) We propose Current Controlled MOS Current Mode Logic (CC-MCML) and have succeeded in fabricating CC-MCML with 180nm CMOS technology for the first time. The performance stability of the CC-MCML inverter on the fluctuations of threshold voltage of NMOS and PMOS is evaluated from the viewpoint of diminishing the bias offset voltage ΔV_B. The ΔV_B, that is defined as (base voltage of output waveform)-(base voltage of input waveform), is a key design parameter because CC-MCML is one type of differential circuit. It is shown that when the threshold voltage of NMOS fluctuates from -70mV to 50mV, and threshold voltage of PMOS fluctuates from -60mV to 60mV, the CC-MCML technique is able to suppress ΔV_B within only 45mV where as the conventional MCML technique caused a maximum ΔV_B of 395mV. In this paper, it is verified for the first time that the proposed CC-MCML is more tolerant against the fluctuations of threshold voltages than the conventional MCML.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Current Controlled-MCML / MCML / Vth Fluctuation / Stability / NMOS / PMOS
Paper # ED2008-83,SDM2008-102
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Committee ED
Conference Date 2008/7/2(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Impact of 180nm Current Controlled MCML for Realizing Stable Circuit Operations under Threshold Voltage Fluctuations(Session8A: Si Devices III)
Sub Title (in English)
Keyword(1) Current Controlled-MCML
Keyword(2) MCML
Keyword(3) Vth Fluctuation
Keyword(4) Stability
Keyword(5) NMOS
Keyword(6) PMOS
1st Author's Name Masashi KAMIYANAGI
1st Author's Affiliation Center for Interdisciplinary Research, Tohoku University()
2nd Author's Name Yuto NORIFUSA
2nd Author's Affiliation Center for Interdisciplinary Research, Tohoku University
3rd Author's Name Tetsuo ENDOH
3rd Author's Affiliation Center for Interdisciplinary Research, Tohoku University
Date 2008-07-11
Paper # ED2008-83,SDM2008-102
Volume (vol) vol.108
Number (no) 121
Page pp.pp.-
#Pages 6
Date of Issue