| Presentation | 2008-07-18 Experimental Study on Radiated Electromagnetic Field Strength due to Micro Gap Discharge Below 1kV Ken KAWAMATA, Shigeki MINEGISHI, Akira HAGA, Osamu Fujiwara, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Relationship between breakdown field strength and radiated electromagnetic field strength was examined in experimental study. In the first, transition duration of voltage and current rise time due to small gap discharge as the low voltage ESD investigated in time domain. The measurement system used the 12GHz experimental system. And so, the sensing system was used an E-field sensor and a H-field sensor. As a consequence of the experiment using the system, voltage and current rise time of transition duration were shown 32ps or less. Besides, breakdown field was examined to corroborate the very fast transition durations of about 32ps. The breakdown field was very high of about 8x10^7V/m in low voltage discharging of below 330V. Also we confirmed that the radiated electromagnetic field strength value in low voltage discharge of about 400V was higher than high voltage discharge of about 900V. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Breakdown field / Radiated electromagnetic field / ESD / Micro gap discharge |
| Paper # | EMCJ2008-45,EMD2008-27 |
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| Conference Information | |
| Committee | EMD |
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| Conference Date | 2008/7/11(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electromechanical Devices (EMD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Experimental Study on Radiated Electromagnetic Field Strength due to Micro Gap Discharge Below 1kV |
| Sub Title (in English) | |
| Keyword(1) | Breakdown field |
| Keyword(2) | Radiated electromagnetic field |
| Keyword(3) | ESD |
| Keyword(4) | Micro gap discharge |
| 1st Author's Name | Ken KAWAMATA |
| 1st Author's Affiliation | Graduate school of Engineering, Hachinohe Inst. of Tech.() |
| 2nd Author's Name | Shigeki MINEGISHI |
| 2nd Author's Affiliation | Graduate school of Engineering, Tohoku Gakuin University |
| 3rd Author's Name | Akira HAGA |
| 3rd Author's Affiliation | Graduate school of Engineering, Tohoku Gakuin University |
| 4th Author's Name | Osamu Fujiwara |
| 4th Author's Affiliation | Graduate school of Engineering, Nagoya Inst. of Tech. |
| Date | 2008-07-18 |
| Paper # | EMCJ2008-45,EMD2008-27 |
| Volume (vol) | vol.108 |
| Number (no) | 145 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |