| Presentation | 2008-06-26 Radiation-Induced Transient-Pulses in Logic LSIs for Use in Space Applications Takahiro MAKINO, Yoshimitsu YANAGAWA, Daisuke KOBAYASHI, Seisuke FUKUDA, Kazuyuki HIROSE, Hirokazu IKEDA, Hirobumi SAITO, Shinobu ONODA, Toshio HIRAO, Takeshi OHSHIMA, Daisuke TAKAHASHI, Shigeru ISHII, Masaki KUSANO, Hiroshi IKEBUCHI, Yoshikatsu KURODA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | SET pulse-widths were measured as a function of LET by using pulse capture circuits. In addition, a scan flip-flop (FF) is designed to observe both single event transient (SET) and single event upset (SEU) soft errors in logic VLSI system. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Soft error / logic VLSI / single event transient |
| Paper # | SANE2008-25 |
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| Conference Information | |
| Committee | SANE |
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| Conference Date | 2008/6/19(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Space, Aeronautical and Navigational Electronics (SANE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Radiation-Induced Transient-Pulses in Logic LSIs for Use in Space Applications |
| Sub Title (in English) | |
| Keyword(1) | Soft error |
| Keyword(2) | logic VLSI |
| Keyword(3) | single event transient |
| 1st Author's Name | Takahiro MAKINO |
| 1st Author's Affiliation | The Graduate University for Advanced Studies() |
| 2nd Author's Name | Yoshimitsu YANAGAWA |
| 2nd Author's Affiliation | The University of Tokyo |
| 3rd Author's Name | Daisuke KOBAYASHI |
| 3rd Author's Affiliation | The Graduate University for Advanced Studies:Japan Aerospace Exploration Agency |
| 4th Author's Name | Seisuke FUKUDA |
| 4th Author's Affiliation | Japan Aerospace Exploration Agency |
| 5th Author's Name | Kazuyuki HIROSE |
| 5th Author's Affiliation | The Graduate University for Advanced Studies:Japan Aerospace Exploration Agency |
| 6th Author's Name | Hirokazu IKEDA |
| 6th Author's Affiliation | The Graduate University for Advanced Studies:Japan Aerospace Exploration Agency |
| 7th Author's Name | Hirobumi SAITO |
| 7th Author's Affiliation | The University of Tokyo:Japan Aerospace Exploration Agency |
| 8th Author's Name | Shinobu ONODA |
| 8th Author's Affiliation | Japan Atomic Energy Agency |
| 9th Author's Name | Toshio HIRAO |
| 9th Author's Affiliation | Japan Atomic Energy Agency |
| 10th Author's Name | Takeshi OHSHIMA |
| 10th Author's Affiliation | Japan Atomic Energy Agency |
| 11th Author's Name | Daisuke TAKAHASHI |
| 11th Author's Affiliation | Mitsubishi Heavy Industries, Ltd. |
| 12th Author's Name | Shigeru ISHII |
| 12th Author's Affiliation | Mitsubishi Heavy Industries, Ltd. |
| 13th Author's Name | Masaki KUSANO |
| 13th Author's Affiliation | Mitsubishi Heavy Industries, Ltd. |
| 14th Author's Name | Hiroshi IKEBUCHI |
| 14th Author's Affiliation | Mitsubishi Heavy Industries, Ltd. |
| 15th Author's Name | Yoshikatsu KURODA |
| 15th Author's Affiliation | Mitsubishi Heavy Industries, Ltd. |
| Date | 2008-06-26 |
| Paper # | SANE2008-25 |
| Volume (vol) | vol.108 |
| Number (no) | 100 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |