Presentation 2008-06-27
Degradation phenomenon of electrical contacts by hammering oscillating mechanism : Contact Resistance
Shin-ichi WADA, Taketo SONODA, Keiji KOSHIDA, Mitsuo KIKUCHI, Hiroaki KUBOTA, Koichiro SAWA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We have developed the hammering oscillating mechanism which could give real vibration to electrical contacts and studied the influences of a micro-oscillating on contact resistance. By the mechanism we made experiments with total operation's number, 30 or 45 millions. After starting, the contact resistance increased in number to about 200Ω. The tendency continued till the end. On the contrary by the sliding contact mechanism we made experiments with total operation's number, 8.5 millions. After starting, the contact resistance increased in number to about 200Ω. Although the two mechanisms are completely different ( in methods, numbers, etc), the results of two tests were almost similar on the oscillating phenomenon. It was suggested that the mechanism could detect the more real degradation phenomenon on contacts by the influences of micro-vibration.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) electrical contact / oscillating mechanism / micro-vibration / contact resistance / sliding contact / sliding mechanism / hammering oscillation mechanism
Paper # EMD2008-15,CPM2008-34,OME2008-36
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Conference Information
Committee OME
Conference Date 2008/6/20(1days)
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Registration To Organic Material Electronics (OME)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Degradation phenomenon of electrical contacts by hammering oscillating mechanism : Contact Resistance
Sub Title (in English)
Keyword(1) electrical contact
Keyword(2) oscillating mechanism
Keyword(3) micro-vibration
Keyword(4) contact resistance
Keyword(5) sliding contact
Keyword(6) sliding mechanism
Keyword(7) hammering oscillation mechanism
1st Author's Name Shin-ichi WADA
1st Author's Affiliation TMC System Co., Ltd.()
2nd Author's Name Taketo SONODA
2nd Author's Affiliation TMC System Co., Ltd.
3rd Author's Name Keiji KOSHIDA
3rd Author's Affiliation TMC System Co., Ltd.
4th Author's Name Mitsuo KIKUCHI
4th Author's Affiliation TMC System Co., Ltd.
5th Author's Name Hiroaki KUBOTA
5th Author's Affiliation TMC System Co., Ltd.
6th Author's Name Koichiro SAWA
6th Author's Affiliation Shin-Kawasaki Town Campus, Keio University
Date 2008-06-27
Paper # EMD2008-15,CPM2008-34,OME2008-36
Volume (vol) vol.108
Number (no) 112
Page pp.pp.-
#Pages 6
Date of Issue