Presentation 2008-06-09
Mobility Enhancement in Ultra Thin Body MOSFETs by Quantum Effects
Toshiro HIRAMOTO, Ken SHIMIZU, Gen TSUTSUI,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) Transport in ultra-thin-body (UTB) SOI MOSFETs is extensively studied by experiments and calculations. When SOI thickness is too thin, the transport properties in UTB devices are strongly affected by the quantum confinement effects. Mobility enhancement in hole is experimentally demonstrated in (110) UTB SOI PFET with SOI thickness of around 4nm due to the suppression of phonon scattering. Mobility enhancement in electron is also experimentally demonstrated in (110) UTB SOI NFET with double-gate operation due to suppression of surface roughness scattering caused by volume inversion effect. It is also found that mobility is enhanced by applying uniaxial tensile stress to (110) UTB MOSFETs. It is essential to understand and positively utilize the new physical phenomena in nanoscale structures in designing nanoscale MOSFETs.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) MOSFET / SOI / Mobility / Quantum Effect / Quantum Confinement / Phonon Scattering / Double-Gate / Strain
Paper # SDM2008-47
Date of Issue

Conference Information
Committee SDM
Conference Date 2008/6/2(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Mobility Enhancement in Ultra Thin Body MOSFETs by Quantum Effects
Sub Title (in English)
Keyword(1) MOSFET
Keyword(2) SOI
Keyword(3) Mobility
Keyword(4) Quantum Effect
Keyword(5) Quantum Confinement
Keyword(6) Phonon Scattering
Keyword(7) Double-Gate
Keyword(8) Strain
1st Author's Name Toshiro HIRAMOTO
1st Author's Affiliation Institute of Industrial Science, University of Tokyo()
2nd Author's Name Ken SHIMIZU
2nd Author's Affiliation Institute of Industrial Science, University of Tokyo
3rd Author's Name Gen TSUTSUI
3rd Author's Affiliation Institute of Industrial Science, University of Tokyo
Date 2008-06-09
Paper # SDM2008-47
Volume (vol) vol.108
Number (no) 80
Page pp.pp.-
#Pages 6
Date of Issue