Presentation 2008-06-13
Surface passivation of AlGaN/GaN heterojunction field-effect transistors by SiN/AlN bilayer structure
Nariaki TANAKA, Yasunobu SUMIDA, Hiroji KAWAI, Toshi-kazu SUZUKI,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) By using AlN single layer, SiN single layer, or SiN/AlN bilayer structure, we have investigated surface passivation of AlGaN/GaN heterojunction field-effect transistors on sapphire substrates. Although the AlN passivation suppresses the drain current decrease at high drain voltage due to self-heating reduction, a deterioration of the off-state and the subthreshold characteristics is observed. On the other hand, the SiN passivation is less effective for the self-heating reduction, but does not deteriorate the off-state and the subthreshold characteristics. The SiN/AlN bilayer passivation does not deteriorate the off-state and the subthreshold characteristics, and is slightly effective for the self-heating reduction.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) AlGaN/GaN heterojunction field-effect transistor / surface passivation / SiN/AlN bilayer structure
Paper # ED2008-22
Date of Issue

Conference Information
Committee ED
Conference Date 2008/6/6(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Surface passivation of AlGaN/GaN heterojunction field-effect transistors by SiN/AlN bilayer structure
Sub Title (in English)
Keyword(1) AlGaN/GaN heterojunction field-effect transistor
Keyword(2) surface passivation
Keyword(3) SiN/AlN bilayer structure
1st Author's Name Nariaki TANAKA
1st Author's Affiliation Center for Nano Materials and Technology, Japan Advanced Institute of Science and Technology()
2nd Author's Name Yasunobu SUMIDA
2nd Author's Affiliation POWDEC K.K.
3rd Author's Name Hiroji KAWAI
3rd Author's Affiliation POWDEC K.K.
4th Author's Name Toshi-kazu SUZUKI
4th Author's Affiliation Center for Nano Materials and Technology, Japan Advanced Institute of Science and Technology
Date 2008-06-13
Paper # ED2008-22
Volume (vol) vol.108
Number (no) 87
Page pp.pp.-
#Pages 4
Date of Issue