| Presentation | 2008-06-20 Transistor Aging and Operational Environment of Logic Circuits Masafumi Haraguchi, Yukiya Miura, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | With the progress of integrated circuit technology, it is becoming important to consider circuit aging. In this work we evaluate influence on circuit characteristic for the operational environment and circuit variation by a circuit simulator, as the first step of aging detection. At first, for a ring oscillator which can be used as a process monitor circuit, we investigate frequency change for the changes of temperature and power supply voltage, respectively. Then we examine a path delay of a circuit consisting of NOT gates by changing the power supply voltage and temperature. In addition, assuming the transistor aging with NBTI, we investigate the change of circuit delay. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Logic circuit / Circuit simulation / Negative bias temperature instability / Reliability |
| Paper # | DC2008-17 |
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| Committee | DC |
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| Conference Date | 2008/6/13(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Transistor Aging and Operational Environment of Logic Circuits |
| Sub Title (in English) | |
| Keyword(1) | Logic circuit |
| Keyword(2) | Circuit simulation |
| Keyword(3) | Negative bias temperature instability |
| Keyword(4) | Reliability |
| 1st Author's Name | Masafumi Haraguchi |
| 1st Author's Affiliation | Kyushu Institute of Technology() |
| 2nd Author's Name | Yukiya Miura |
| 2nd Author's Affiliation | Tokyo Metropolitan University |
| 3rd Author's Name | Seiji Kajihara |
| 3rd Author's Affiliation | Kyushu Institute of Technology |
| 4th Author's Name | Yasuo Sato |
| 4th Author's Affiliation | Kyushu Institute of Technology |
| 5th Author's Name | Kohei Miyase |
| 5th Author's Affiliation | Kyushu Institute of Technology |
| 6th Author's Name | Xiaoqing Wen |
| 6th Author's Affiliation | Kyushu Institute of Technology |
| Date | 2008-06-20 |
| Paper # | DC2008-17 |
| Volume (vol) | vol.108 |
| Number (no) | 99 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |