Presentation | 2008-06-20 Improving the Diagnostic Quality of Open Faults Koji YAMAZAKI, Toshiyuki TSUTSUMI, Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Takashi AIKYO, Hiroyuki YOTSUYANAGI, Masaki HASHIZUME, Yuzo TAKAMATSU, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | With the shrinking process technologies and the use of copper process, open defects on interconnect wires, contacts and vias often cause failure. Development of an efficient fault diagnosis method for open faults is desired. In this paper, we propose a method to dianose open faults in which the logical value of the line with open defect is represented as a threshold function of its adjacent lines. By using the threshold function, we can deduce not only a faulty line but also an open defect site at the fault line. Experimental results show that the proposed method can identify an exact faulty line in most cases with a very small computation cost. The proposed method can also identify the open defect site within 25%-length of the faulty line. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | fault diagnosis / open faults / adjacent lines / threshold function / pass/fail information |
Paper # | DC2008-16 |
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Conference Information | |
Committee | DC |
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Conference Date | 2008/6/13(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
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Paper Information | |
Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Improving the Diagnostic Quality of Open Faults |
Sub Title (in English) | |
Keyword(1) | fault diagnosis |
Keyword(2) | open faults |
Keyword(3) | adjacent lines |
Keyword(4) | threshold function |
Keyword(5) | pass/fail information |
1st Author's Name | Koji YAMAZAKI |
1st Author's Affiliation | School of Information and Communication, Meiji University() |
2nd Author's Name | Toshiyuki TSUTSUMI |
2nd Author's Affiliation | School of Science and Technology, Meiji University |
3rd Author's Name | Hiroshi TAKAHASHI |
3rd Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
4th Author's Name | Yoshinobu HIGAMI |
4th Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
5th Author's Name | Takashi AIKYO |
5th Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
6th Author's Name | Hiroyuki YOTSUYANAGI |
6th Author's Affiliation | Graduate School of Advanced Technology and Science, the University of Tokushima |
7th Author's Name | Masaki HASHIZUME |
7th Author's Affiliation | Graduate School of Advanced Technology and Science, the University of Tokushima |
8th Author's Name | Yuzo TAKAMATSU |
8th Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
Date | 2008-06-20 |
Paper # | DC2008-16 |
Volume (vol) | vol.108 |
Number (no) | 99 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |