Presentation 2008-06-20
Improving the Diagnostic Quality of Open Faults
Koji YAMAZAKI, Toshiyuki TSUTSUMI, Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Takashi AIKYO, Hiroyuki YOTSUYANAGI, Masaki HASHIZUME, Yuzo TAKAMATSU,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) With the shrinking process technologies and the use of copper process, open defects on interconnect wires, contacts and vias often cause failure. Development of an efficient fault diagnosis method for open faults is desired. In this paper, we propose a method to dianose open faults in which the logical value of the line with open defect is represented as a threshold function of its adjacent lines. By using the threshold function, we can deduce not only a faulty line but also an open defect site at the fault line. Experimental results show that the proposed method can identify an exact faulty line in most cases with a very small computation cost. The proposed method can also identify the open defect site within 25%-length of the faulty line.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) fault diagnosis / open faults / adjacent lines / threshold function / pass/fail information
Paper # DC2008-16
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Committee DC
Conference Date 2008/6/13(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Improving the Diagnostic Quality of Open Faults
Sub Title (in English)
Keyword(1) fault diagnosis
Keyword(2) open faults
Keyword(3) adjacent lines
Keyword(4) threshold function
Keyword(5) pass/fail information
1st Author's Name Koji YAMAZAKI
1st Author's Affiliation School of Information and Communication, Meiji University()
2nd Author's Name Toshiyuki TSUTSUMI
2nd Author's Affiliation School of Science and Technology, Meiji University
3rd Author's Name Hiroshi TAKAHASHI
3rd Author's Affiliation Graduate School of Science and Engineering, Ehime University
4th Author's Name Yoshinobu HIGAMI
4th Author's Affiliation Graduate School of Science and Engineering, Ehime University
5th Author's Name Takashi AIKYO
5th Author's Affiliation Graduate School of Science and Engineering, Ehime University
6th Author's Name Hiroyuki YOTSUYANAGI
6th Author's Affiliation Graduate School of Advanced Technology and Science, the University of Tokushima
7th Author's Name Masaki HASHIZUME
7th Author's Affiliation Graduate School of Advanced Technology and Science, the University of Tokushima
8th Author's Name Yuzo TAKAMATSU
8th Author's Affiliation Graduate School of Science and Engineering, Ehime University
Date 2008-06-20
Paper # DC2008-16
Volume (vol) vol.108
Number (no) 99
Page pp.pp.-
#Pages 6
Date of Issue