Presentation | 2008-02-08 Fault Diagnosis of Analog Circuits by Using Multiple Transistors and Data Samplings Jiro KATO, Yukiya MIURA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In this paper, we propose two methods for diagnosing analog circuits by using multiple transistors and data samplings, which are based on the operation-region model and the X-Y zoning method. The X-Y zoning method uses the characteristics of circuit input voltage and output voltage. The operation-region model can be used for modeling circuit behaviors by utilizing changes in the operation regions of MOS transistors. We demonstrate the effectiveness of the proposed methods by applying them to ITC'97 benchmark circuits with hard faults and soft faults. These methods can improve diagnostic performance and reduce a diagnostic sequence length and processing time. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Analog circuits / Fault diagnosis / MOS transistors / Operation-region model / X-Y zoning method |
Paper # | DC2007-82 |
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Committee | DC |
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Conference Date | 2008/2/1(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Fault Diagnosis of Analog Circuits by Using Multiple Transistors and Data Samplings |
Sub Title (in English) | |
Keyword(1) | Analog circuits |
Keyword(2) | Fault diagnosis |
Keyword(3) | MOS transistors |
Keyword(4) | Operation-region model |
Keyword(5) | X-Y zoning method |
1st Author's Name | Jiro KATO |
1st Author's Affiliation | Graduate School of System Design, Tokyo Metropolitan University() |
2nd Author's Name | Yukiya MIURA |
2nd Author's Affiliation | Graduate School of System Design, Tokyo Metropolitan University |
Date | 2008-02-08 |
Paper # | DC2007-82 |
Volume (vol) | vol.107 |
Number (no) | 482 |
Page | pp.pp.- |
#Pages | 6 |
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