Presentation 2008-02-08
Fault Diagnosis of Analog Circuits by Using Multiple Transistors and Data Samplings
Jiro KATO, Yukiya MIURA,
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Abstract(in English) In this paper, we propose two methods for diagnosing analog circuits by using multiple transistors and data samplings, which are based on the operation-region model and the X-Y zoning method. The X-Y zoning method uses the characteristics of circuit input voltage and output voltage. The operation-region model can be used for modeling circuit behaviors by utilizing changes in the operation regions of MOS transistors. We demonstrate the effectiveness of the proposed methods by applying them to ITC'97 benchmark circuits with hard faults and soft faults. These methods can improve diagnostic performance and reduce a diagnostic sequence length and processing time.
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Keyword(in English) Analog circuits / Fault diagnosis / MOS transistors / Operation-region model / X-Y zoning method
Paper # DC2007-82
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Committee DC
Conference Date 2008/2/1(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Fault Diagnosis of Analog Circuits by Using Multiple Transistors and Data Samplings
Sub Title (in English)
Keyword(1) Analog circuits
Keyword(2) Fault diagnosis
Keyword(3) MOS transistors
Keyword(4) Operation-region model
Keyword(5) X-Y zoning method
1st Author's Name Jiro KATO
1st Author's Affiliation Graduate School of System Design, Tokyo Metropolitan University()
2nd Author's Name Yukiya MIURA
2nd Author's Affiliation Graduate School of System Design, Tokyo Metropolitan University
Date 2008-02-08
Paper # DC2007-82
Volume (vol) vol.107
Number (no) 482
Page pp.pp.-
#Pages 6
Date of Issue