Presentation 2008-02-08
Note on Testing of RF Transmitter Considering Component Variation
Tatsuro ENDO, Masayuki ARAI, Kazuhiko IWASAKI,
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Abstract(in English) As the higher integration level and more complexity on RF ICs, testing of them has been becoming a important problem. RF transmitters have to satisfy the specification of error vector magnitude (EVM) which is defined according to the data rate. Since EVM measurements require expensive test instruments, alternative testing schemes have been explored, such as bit error rate (BER) measurement. BER has to satisfy the specification even under worst-case environment, but setting such environment during testing is challenging. BER is also generally low and its measurement needs long time. Therefore, BER estimation based on the measurement of the other parameters has been studied. In this paper we study on constellation analysis of RF transmitter circuits, considering the deviation of the parameters from ideal values. We show the variation of the received signals due to parametric error. We also evaluate EVM and BER by using the simulation for the modeled RF transmitter.
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Keyword(in English) RF transmitter / constellation / BER / EVM
Paper # DC2007-81
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Committee DC
Conference Date 2008/2/1(1days)
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Paper Information
Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Note on Testing of RF Transmitter Considering Component Variation
Sub Title (in English)
Keyword(1) RF transmitter
Keyword(2) constellation
Keyword(3) BER
Keyword(4) EVM
1st Author's Name Tatsuro ENDO
1st Author's Affiliation Faculty of System Design, Tokyo Metropolitan University()
2nd Author's Name Masayuki ARAI
2nd Author's Affiliation Graduate School of System Design, Tokyo Metropolitan University
3rd Author's Name Kazuhiko IWASAKI
3rd Author's Affiliation Graduate School of System Design, Tokyo Metropolitan University
Date 2008-02-08
Paper # DC2007-81
Volume (vol) vol.107
Number (no) 482
Page pp.pp.-
#Pages 6
Date of Issue