Presentation 2008-02-08
Comparison of exact solutions and greedy solutions in static test compaction
Kei Yagisawa, Koji Yamazaki, Toshinori Hosokawa, Hisao Tamaki,
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Abstract(in English) In this paper, we formulate static test compaction using don't cares as a minimum clique cover problem and a vertex coloring problem. We made experiments on exact solution methods and greedy solution methods. For most test patterns used in this experiment, the upper and lower bounds are close to the exact solution. This holds for wide variety of test generation methods. We coclude that greedy solutions are very close to exact solutions and there is small advantage in computing exact solutions for many circuits. Moreover, we indicate the subset of test patterns which is a bottleneck of test compaction, and consider the way to improve the compaction efficiency.
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Keyword(in English) Static Compaction / Minimum Clique Cover / Maximum Independent Sets
Paper # DC2007-79
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Conference Date 2008/2/1(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Comparison of exact solutions and greedy solutions in static test compaction
Sub Title (in English)
Keyword(1) Static Compaction
Keyword(2) Minimum Clique Cover
Keyword(3) Maximum Independent Sets
1st Author's Name Kei Yagisawa
1st Author's Affiliation Department of Science and Technology, Meiji University()
2nd Author's Name Koji Yamazaki
2nd Author's Affiliation School of Information and Communication, Meiji University
3rd Author's Name Toshinori Hosokawa
3rd Author's Affiliation College of Industrial Technology, Nihon University
4th Author's Name Hisao Tamaki
4th Author's Affiliation Department of Science and Technology, Meiji University
Date 2008-02-08
Paper # DC2007-79
Volume (vol) vol.107
Number (no) 482
Page pp.pp.-
#Pages 6
Date of Issue