Presentation 2008-02-08
A Test Generation Method for State Observable FSMs to Increase Defect Coverage Under Test Length Constraint
Ryoichi INOUE, Toshinori HOSOKAWA, Hideo FUJIWARA,
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Abstract(in English) We proposed a fault-independent test generation method for logical fault testing of state-observable FSMs and a fault-dependent test generation method for timing fault testing of state-observable FSMs to reduce over testing and under testing. Since the test sequence generated by a fault-independent test generation method is detectable all kinds of logical faults and timing faults, the test quality is very high. However, the test length is long for FSMs with many state transitions. While, the test sequence generated by a fault-dependent test generation method is detectable all testable faults for specified fault models, but does not achieve high fault coverage for other fault models. In this paper, we propose a test generation method to detect all testable faults for specified fault models and to increase fault coverage for other main fault models as much as possible for state-observable FSMs under a test length constraint. We give experimental results for MCNC'91 benchmark circuits to evaluate bridging fault coverage, transition fault coverage, and statistical delay quality level and show the effectiveness of the proposed test generation method compared with a stuck-at fault dependent test generation method.
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Keyword(in English) State-observable FSMs / logical fault testing / timing fault testing / fault sensitization coverage / n-detection
Paper # DC2007-78
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Conference Date 2008/2/1(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Test Generation Method for State Observable FSMs to Increase Defect Coverage Under Test Length Constraint
Sub Title (in English)
Keyword(1) State-observable FSMs
Keyword(2) logical fault testing
Keyword(3) timing fault testing
Keyword(4) fault sensitization coverage
Keyword(5) n-detection
1st Author's Name Ryoichi INOUE
1st Author's Affiliation Graduate School of Industrial Technology, Nihon University()
2nd Author's Name Toshinori HOSOKAWA
2nd Author's Affiliation College of Industrial Technology, Nihon University
3rd Author's Name Hideo FUJIWARA
3rd Author's Affiliation Graduate School of Information Science, Nara Institute of Science and Technology(NAIST)
Date 2008-02-08
Paper # DC2007-78
Volume (vol) vol.107
Number (no) 482
Page pp.pp.-
#Pages 8
Date of Issue