| Presentation | 2008-02-08 A Test Generation Method for State Observable FSMs to Increase Defect Coverage Under Test Length Constraint Ryoichi INOUE, Toshinori HOSOKAWA, Hideo FUJIWARA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We proposed a fault-independent test generation method for logical fault testing of state-observable FSMs and a fault-dependent test generation method for timing fault testing of state-observable FSMs to reduce over testing and under testing. Since the test sequence generated by a fault-independent test generation method is detectable all kinds of logical faults and timing faults, the test quality is very high. However, the test length is long for FSMs with many state transitions. While, the test sequence generated by a fault-dependent test generation method is detectable all testable faults for specified fault models, but does not achieve high fault coverage for other fault models. In this paper, we propose a test generation method to detect all testable faults for specified fault models and to increase fault coverage for other main fault models as much as possible for state-observable FSMs under a test length constraint. We give experimental results for MCNC'91 benchmark circuits to evaluate bridging fault coverage, transition fault coverage, and statistical delay quality level and show the effectiveness of the proposed test generation method compared with a stuck-at fault dependent test generation method. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | State-observable FSMs / logical fault testing / timing fault testing / fault sensitization coverage / n-detection |
| Paper # | DC2007-78 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2008/2/1(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Test Generation Method for State Observable FSMs to Increase Defect Coverage Under Test Length Constraint |
| Sub Title (in English) | |
| Keyword(1) | State-observable FSMs |
| Keyword(2) | logical fault testing |
| Keyword(3) | timing fault testing |
| Keyword(4) | fault sensitization coverage |
| Keyword(5) | n-detection |
| 1st Author's Name | Ryoichi INOUE |
| 1st Author's Affiliation | Graduate School of Industrial Technology, Nihon University() |
| 2nd Author's Name | Toshinori HOSOKAWA |
| 2nd Author's Affiliation | College of Industrial Technology, Nihon University |
| 3rd Author's Name | Hideo FUJIWARA |
| 3rd Author's Affiliation | Graduate School of Information Science, Nara Institute of Science and Technology(NAIST) |
| Date | 2008-02-08 |
| Paper # | DC2007-78 |
| Volume (vol) | vol.107 |
| Number (no) | 482 |
| Page | pp.pp.- |
| #Pages | 8 |
| Date of Issue | |