Presentation 2008-02-08
An evaluation of encryption LSI testability against scan based attack
Yuma ITO, Masayoshi YOSHIMURA, Hiroto YASUURA,
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Abstract(in English) Recently, an encryption LSI is embedded in a variety of digital products for security and copyright protection. Most LSI including encryption LSI has a scan path for a test. However, there is a risk that the secret information is leaked from a scan path. In this paper, we show the trade-off between testability and security by changing the composition of scan path. We insert various scan path patterns in a hardware implementation of the DES, and evaluate these testability and security. In addition, we propose a countermeasure against the scan based attack, and evaluate the countermeasure from the viewpoints of testability and security. The proposed countermeasure can achieve about 98% of high test coverage with preventing scan based attack.
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Keyword(in English) scan based attack / DES / testability / security
Paper # DC2007-76
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Committee DC
Conference Date 2008/2/1(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) An evaluation of encryption LSI testability against scan based attack
Sub Title (in English)
Keyword(1) scan based attack
Keyword(2) DES
Keyword(3) testability
Keyword(4) security
1st Author's Name Yuma ITO
1st Author's Affiliation Department of Electrical Engineering & Computer Science, Kyushu University()
2nd Author's Name Masayoshi YOSHIMURA
2nd Author's Affiliation Faculty of Information Science and Electrical Engineering, Kyushu University
3rd Author's Name Hiroto YASUURA
3rd Author's Affiliation Faculty of Information Science and Electrical Engineering, Kyushu University
Date 2008-02-08
Paper # DC2007-76
Volume (vol) vol.107
Number (no) 482
Page pp.pp.-
#Pages 6
Date of Issue