Presentation 2008-02-08
Fault Secure Property for Soft Error on FPGA Using Two-Rail Logic
Takehiro MIURA, Kazuteru NAMBA, Hideo ITO,
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Abstract(in English) In recent high-density VLSIs, soft errors frequently occur. Soft errors cause improper operation of systems. Recently, rapid product development cycle is required. So, Field Programmable Gate Arrays (FPGAs) which provide instant manufacturing are widely used. Usually, FPGAs comprise SRAMs storing configuration data. If soft errors occur on the SRAMs, configuration data are improperly changed and the system configured on the FPGA goes into wrong operation. In other words, FPGAs are sensitive to soft errors. So, soft error tolerant technologies for FPGAs are important and studied by many researchers. Two-rail logic is one of well known technologies capable of tolerating soft errors. Logic circuits constructed with two-rail logic are fault secure for single soft errors. However, it has not been discussed whether two-rail logic circuits built on FPGAs are fault secure. This paper gives evidence that two-rail logic circuits on FPGAs are fault secure for single soft errors.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) FPGA / Two-rail Logic / Fault Secure / Soft Error
Paper # DC2007-74
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Committee DC
Conference Date 2008/2/1(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Fault Secure Property for Soft Error on FPGA Using Two-Rail Logic
Sub Title (in English)
Keyword(1) FPGA
Keyword(2) Two-rail Logic
Keyword(3) Fault Secure
Keyword(4) Soft Error
1st Author's Name Takehiro MIURA
1st Author's Affiliation Graduate School of Science and Technology, Chiba University()
2nd Author's Name Kazuteru NAMBA
2nd Author's Affiliation Graduate School of Advanced Integration Science, Chiba University
3rd Author's Name Hideo ITO
3rd Author's Affiliation Graduate School of Advanced Integration Science, Chiba University
Date 2008-02-08
Paper # DC2007-74
Volume (vol) vol.107
Number (no) 482
Page pp.pp.-
#Pages 6
Date of Issue