| Presentation | 2008-02-08 A variable n-detection test generation method to increase fault sensitization coverage and evaluation of its test quality Takeshi TOMITA, Toshinori HOSOKAWA, Koji YAMAZAKI, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | N-deteciton test generation is known as one of the generation method of high-quality test set. However, many tests which hardly contribute to improve test quality may be contained in a test set generated base on conventional definitions of n-detection. A fault sensitization coverage oriented n-detection test generation (FSOD) was proposed as a test generation method that address this problem. However, it is difficult to improve fault sensitization coverage on the number of n detection times for each fault even if test patterns are generated by FSOD. In this paper, we propose a variable n-detection test generation method to further improve fault sensitization coverage and evaluate the test quality using statistical delay quality level. In the proposed method, the number of detection times for each fault is made variable. The experimental results using ISCAS89 benchmark circuits show that when fault sensitization coverage is increasing, statistical delay quality level is also increasing. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | n-detection test / fault sensitization coverage / valuable n-detection test / statistical delay quality level |
| Paper # | DC2007-71 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2008/2/1(1days) |
| Place (in Japanese) | (See Japanese page) |
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| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A variable n-detection test generation method to increase fault sensitization coverage and evaluation of its test quality |
| Sub Title (in English) | |
| Keyword(1) | n-detection test |
| Keyword(2) | fault sensitization coverage |
| Keyword(3) | valuable n-detection test |
| Keyword(4) | statistical delay quality level |
| 1st Author's Name | Takeshi TOMITA |
| 1st Author's Affiliation | Graduate School of Industrial Technology, Nihon University() |
| 2nd Author's Name | Toshinori HOSOKAWA |
| 2nd Author's Affiliation | College of Industrial Technology, Nihon University |
| 3rd Author's Name | Koji YAMAZAKI |
| 3rd Author's Affiliation | School of Information and Communication, Meiji University |
| Date | 2008-02-08 |
| Paper # | DC2007-71 |
| Volume (vol) | vol.107 |
| Number (no) | 482 |
| Page | pp.pp.- |
| #Pages | 7 |
| Date of Issue | |