| Presentation | 2008-02-08 Diagnostic Test Generation for Transition Faults Takashi AIKYO, Yoshinobu HIGAMI, Hiroshi TAKAHASHI, Toru KIKKAWA, Yuzo TAKAMATSU, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In modern high-speed LSIs, defects that cause timing failure occur often, and thus their detection and diagnosis are getting crucial. In order to reduce candidate faults in fault diagnosis, the quality of diagnostic test patterns must be made high. In this research, we propose a test generation method for diagnosis of transition faults by using stuck-at test generation tool. First, we apply test patterns generated for detection of transition faults and obtain fault pairs that are not distinguished by these test patterns. In order to generate test patterns for distinguishing those indistinguished pairs, we add some logic to the original circuit and use a stuck-at test generation tool. This modified circuit is used during only the test generation process, and thus the method is different from a design-for-testability method. Moreover we identify indistinguishable fault pairs by circuit structure analysis. Experimental results for ISCAS benchmark circuits demonstrate the effectiveness of the proposed method. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | diagnostic tests / test generation / transition faults / delay faults / distinguishability |
| Paper # | DC2007-69 |
| Date of Issue |
| Conference Information | |
| Committee | DC |
|---|---|
| Conference Date | 2008/2/1(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Dependable Computing (DC) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Diagnostic Test Generation for Transition Faults |
| Sub Title (in English) | |
| Keyword(1) | diagnostic tests |
| Keyword(2) | test generation |
| Keyword(3) | transition faults |
| Keyword(4) | delay faults |
| Keyword(5) | distinguishability |
| 1st Author's Name | Takashi AIKYO |
| 1st Author's Affiliation | Graduate School of Science and Engineering, Ehime University:Semiconductor Technology Academic Research Center() |
| 2nd Author's Name | Yoshinobu HIGAMI |
| 2nd Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 3rd Author's Name | Hiroshi TAKAHASHI |
| 3rd Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 4th Author's Name | Toru KIKKAWA |
| 4th Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 5th Author's Name | Yuzo TAKAMATSU |
| 5th Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| Date | 2008-02-08 |
| Paper # | DC2007-69 |
| Volume (vol) | vol.107 |
| Number (no) | 482 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |