| Presentation | 2008-02-08 Fault Diagnosis for Dynamic Open Faults with Considering Adjacent Lines Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Takashi AIKYO, Syuhei KADOYAMA, Tetsuya WATANABE, Yuzo TAKAMATSU, Toshiyuki TSUTUSMI, Kouji YAMAZAKI, Hiroyuki YOTSUYANAGI, Masaki HASHIZUME, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In modern manufacturing technologies with the shrinking of manufacturing process, LSIs may have several metal interconnect layers and the long copper (Cu) interconnect wires. Under the modern manufacturing technologies, the open defect is the one of the significant issues to maintain the reliability of LSI. In this paper, we propose a dynamic open fault model with considering the affects of the adjacent lines. Under the open fault model, the fault is excited depending on the signal transitions at the adjacent lines that are assigned by the pair of test patterns. Next, we propose the diagnosis method based on the dynamic open fault model. The proposed method uses not only fail test patterns but also the pass test patterns. Base on results of the diagnostic fault simulation, the candidate faults are ranked. Experimental results show that the proposed method is able to diagnose the open faults. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | open faults / fault diagnosis / fail test patteren / pass test pattern / diagnostic fault simulation |
| Paper # | DC2007-68 |
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| Committee | DC |
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| Conference Date | 2008/2/1(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Fault Diagnosis for Dynamic Open Faults with Considering Adjacent Lines |
| Sub Title (in English) | |
| Keyword(1) | open faults |
| Keyword(2) | fault diagnosis |
| Keyword(3) | fail test patteren |
| Keyword(4) | pass test pattern |
| Keyword(5) | diagnostic fault simulation |
| 1st Author's Name | Hiroshi TAKAHASHI |
| 1st Author's Affiliation | Graduate School of Science and Engineering, Ehime University() |
| 2nd Author's Name | Yoshinobu HIGAMI |
| 2nd Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 3rd Author's Name | Takashi AIKYO |
| 3rd Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 4th Author's Name | Syuhei KADOYAMA |
| 4th Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 5th Author's Name | Tetsuya WATANABE |
| 5th Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 6th Author's Name | Yuzo TAKAMATSU |
| 6th Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 7th Author's Name | Toshiyuki TSUTUSMI |
| 7th Author's Affiliation | Meiji University |
| 8th Author's Name | Kouji YAMAZAKI |
| 8th Author's Affiliation | Meiji University |
| 9th Author's Name | Hiroyuki YOTSUYANAGI |
| 9th Author's Affiliation | Graduate School of Advanced Technology and Science, the Univeresity of Tokushima |
| 10th Author's Name | Masaki HASHIZUME |
| 10th Author's Affiliation | Graduate School of Advanced Technology and Science, the Univeresity of Tokushima |
| Date | 2008-02-08 |
| Paper # | DC2007-68 |
| Volume (vol) | vol.107 |
| Number (no) | 482 |
| Page | pp.pp.- |
| #Pages | 6 |
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