Presentation 2008-03-03
Displacement and channel current simultaneous measurements in p-type and n-type organic thin-film transistors
Seiichi SUZUKI, Hirokazu IMAHARA, Yutaka MAJIMA,
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Abstract(in English) Carrier injection and transport properties such as mobility, threshold voltage, and carrier injection voltage at source electrode were evaluated in p-type pentacene and n-type perylene derivative organic thin-film transistors (OTFTs) using displacement and channel current simultaneous measurements. From gate voltage frequencies of displacement current and channel current, in the case of pentacene thin-film transistors (TFTs) mobility, threshold voltage, and carrier injection voltage at source electrode showed no frequency dependences at frequencies between 1 and 50kHz. On the other hand, in the case of PTCDI-C8 TFT, they showed frequency dependences from 10Hz to 1kHz; it was observed that threshold voltage shift due to bias stress, and that carrier injection process did not follow the gate voltage sweep.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) organic thin-film transistors / displacement and channel current simultaneous measurements / frequency dependences / pentacene / PTCDI-C8
Paper # EID2007-105,OME2007-87
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Committee EID
Conference Date 2008/2/25(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
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Title (in English) Displacement and channel current simultaneous measurements in p-type and n-type organic thin-film transistors
Sub Title (in English)
Keyword(1) organic thin-film transistors
Keyword(2) displacement and channel current simultaneous measurements
Keyword(3) frequency dependences
Keyword(4) pentacene
Keyword(5) PTCDI-C8
1st Author's Name Seiichi SUZUKI
1st Author's Affiliation Department of Physical Electronics, Tokyo Institute of Technology()
2nd Author's Name Hirokazu IMAHARA
2nd Author's Affiliation Department of Physical Electronics, Tokyo Institute of Technology
3rd Author's Name Yutaka MAJIMA
3rd Author's Affiliation Department of Physical Electronics, Tokyo Institute of Technology
Date 2008-03-03
Paper # EID2007-105,OME2007-87
Volume (vol) vol.107
Number (no) 521
Page pp.pp.-
#Pages 6
Date of Issue