| Presentation | 2008-04-18 Analysis of Wear-Out Degradation of a Ru-doped SIBH InGaAsP DFB laser Using an Optical-Beam-Induced Current Monitor Tatsuya TAKESHITA, Ryuzo IGA, Mitsuru SUGO, Yasuhiro Kondo, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We investigated the degradation behavior of InGaAsP distributed feedback lasers (DFBs) at high temperature by employing the optical-beam-induced current (OBIC) measurement technique. The DFB lasers with Ru-doped semi-insulating buried heterostructure operated very stably at an ambient temperature of 85℃. It is found that there is more degradation in the SCH layer than in the active layer. We presume that the degradation mechanism is governed by diffused defects with a vertical direction in the crystal plane. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | semiconductor lasers / quantum well lasers / failure analysis / reliability / aging |
| Paper # | R2008-3,CPM2008-3,OPE2008-3 |
| Date of Issue |
| Conference Information | |
| Committee | CPM |
|---|---|
| Conference Date | 2008/4/11(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Component Parts and Materials (CPM) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Analysis of Wear-Out Degradation of a Ru-doped SIBH InGaAsP DFB laser Using an Optical-Beam-Induced Current Monitor |
| Sub Title (in English) | |
| Keyword(1) | semiconductor lasers |
| Keyword(2) | quantum well lasers |
| Keyword(3) | failure analysis |
| Keyword(4) | reliability |
| Keyword(5) | aging |
| 1st Author's Name | Tatsuya TAKESHITA |
| 1st Author's Affiliation | NTT Photonics Laboratories, NTT Corporation() |
| 2nd Author's Name | Ryuzo IGA |
| 2nd Author's Affiliation | NTT Photonics Laboratories, NTT Corporation |
| 3rd Author's Name | Mitsuru SUGO |
| 3rd Author's Affiliation | NTT Photonics Laboratories, NTT Corporation |
| 4th Author's Name | Yasuhiro Kondo |
| 4th Author's Affiliation | NTT Photonics Laboratories, NTT Corporation |
| Date | 2008-04-18 |
| Paper # | R2008-3,CPM2008-3,OPE2008-3 |
| Volume (vol) | vol.108 |
| Number (no) | 8 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |