Presentation 2008-05-23
Designing And Evaluating Dynamically Reconfigurable Processor With Power Gating Technique
Yoshiki SAITO, Tomoaki SHIRAI, Takuro NAKAMURA, Takashi NISHIMURA, Yohei HASEGAWA, Satoshi TSUTSUMI, Toshihiro KASHIMA, Mitsutaka NAKATA, Seidai TAKEDA, Kimiyoshi USAMI, Hideharu AMANO,
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Abstract(in English) A dynamically recofigurable processor achieves high performance making the best use of high degree of parallelism with its Processing Elements (PEs). However, while an application is running, not all PEs can be used for computation. Recently, the ratio of leakage power is increasing, due to the progressing process rule. Since even unused PEs consume the leakage power, it may shorten the battery driving time for mobile devices. Here, to alleviate this problem, we propose a dynamically reconfigurable architecture with power gating technique, MuCCRA2.32b-PG. By using the fine grained power gating technique, the power of unused PEs or units is cut off, if the sleeping time is more than the break-even point. As a result, 4.91% of area overhead came out, due to inserting sleep transistors and isolation cells. When the sleep signal was controlled for each PEs, 45% of leakage power was cut down at the maximum. during the execution of an application. On the other hand, when the signal was controlled for each units inside PEs, 48% of leakage power was reduced.
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Keyword(in English) Dynamically Reconfigurable Processors / Fine Grained Power Gating / Leakage Power / Break Even Point
Paper # RECONF2008-10
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Conference Information
Committee RECONF
Conference Date 2008/5/15(1days)
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Paper Information
Registration To Reconfigurable Systems (RECONF)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Designing And Evaluating Dynamically Reconfigurable Processor With Power Gating Technique
Sub Title (in English)
Keyword(1) Dynamically Reconfigurable Processors
Keyword(2) Fine Grained Power Gating
Keyword(3) Leakage Power
Keyword(4) Break Even Point
1st Author's Name Yoshiki SAITO
1st Author's Affiliation Faculty of Science and Technology, Keio University()
2nd Author's Name Tomoaki SHIRAI
2nd Author's Affiliation Faculty of Technology, Shibaura Institute of Technology
3rd Author's Name Takuro NAKAMURA
3rd Author's Affiliation Faculty of Science and Technology, Keio University
4th Author's Name Takashi NISHIMURA
4th Author's Affiliation Faculty of Science and Technology, Keio University
5th Author's Name Yohei HASEGAWA
5th Author's Affiliation Faculty of Science and Technology, Keio University
6th Author's Name Satoshi TSUTSUMI
6th Author's Affiliation Faculty of Science and Technology, Keio University
7th Author's Name Toshihiro KASHIMA
7th Author's Affiliation Faculty of Technology, Shibaura Institute of Technology
8th Author's Name Mitsutaka NAKATA
8th Author's Affiliation Faculty of Technology, Shibaura Institute of Technology
9th Author's Name Seidai TAKEDA
9th Author's Affiliation Faculty of Technology, Shibaura Institute of Technology
10th Author's Name Kimiyoshi USAMI
10th Author's Affiliation Faculty of Technology, Shibaura Institute of Technology
11th Author's Name Hideharu AMANO
11th Author's Affiliation Faculty of Science and Technology, Keio University
Date 2008-05-23
Paper # RECONF2008-10
Volume (vol) vol.108
Number (no) 48
Page pp.pp.-
#Pages 6
Date of Issue