Presentation	2008-05-16 Linearity of resistors : Measurement of electrical distortion caused by resistors Isao Minowa, Yuji Ide, Shunsuke Kaneko,
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Abstract(in English)	Electrical nonlinearity of various resistors were tested for defining goodness which may include such as absolute and precision values, low noise, flat temperature coefficient and high frequency dependency etc. by a method of distortion voltage measurement. Electrical nonlinearity is measured by 10 kHz current flowing and 30 kHz voltage detecting. The results show that foil type resistors have very low distortions compare to carbon and metal film type of ones. A difference of a very small distortion voltage between foreign made and Japanese made is observed.
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Paper #	EMD2008-9
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Committee	EMD
Conference Date	2008/5/9(1days)
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Registration To	Electromechanical Devices (EMD)
Language	JPN
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Title (in English)	Linearity of resistors : Measurement of electrical distortion caused by resistors
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1st Author's Name	Isao Minowa
1st Author's Affiliation	Intelligent Information Systems, Tamagawa University()
2nd Author's Name	Yuji Ide
2nd Author's Affiliation	Intelligent Information Systems, Tamagawa University
3rd Author's Name	Shunsuke Kaneko
3rd Author's Affiliation	Intelligent Information Systems, Tamagawa University
Date	2008-05-16
Paper #	EMD2008-9
Volume (vol)	vol.108
Number (no)	41
Page	pp.pp.-
#Pages	6
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