Presentation 2008-05-16
On-resistance and Breakdown Voltage of Enhancement-Mode AlGaN/GaN Junction HFET using p-GaN Gate Contact
Ryohei Nega, Katsutoshi Mizuno, Motoaki Iwaya, Satoshi Kamiyama, Hiroshi Amano, Isamu Akasaki,
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Abstract(in English) This paper reports normally-off mode nitride-based field-effect transistor using p-type gate contact. In order to realize application to power switching devices, it is necessary to reduce on-resistance as well as to keep the breakdown voltage high enough. By changing the device parameters such as source-drain distance, gate length, etc., correlation between on-resistance and breakdown voltage was deduced experimentally.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) AlGaN / GaN / Junction HFET / p-type GaN gate / normally-off / low on-resistance / Breakdown Voltage
Paper # ED2008-13,CPM2008-21,SDM2008-33
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Committee CPM
Conference Date 2008/5/8(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) On-resistance and Breakdown Voltage of Enhancement-Mode AlGaN/GaN Junction HFET using p-GaN Gate Contact
Sub Title (in English)
Keyword(1) AlGaN
Keyword(2) GaN
Keyword(3) Junction HFET
Keyword(4) p-type GaN gate
Keyword(5) normally-off
Keyword(6) low on-resistance
Keyword(7) Breakdown Voltage
1st Author's Name Ryohei Nega
1st Author's Affiliation Faculty of Science and Technology, Meijo University()
2nd Author's Name Katsutoshi Mizuno
2nd Author's Affiliation Faculty of Science and Technology, Meijo University
3rd Author's Name Motoaki Iwaya
3rd Author's Affiliation Faculty of Science and Technology, Meijo University
4th Author's Name Satoshi Kamiyama
4th Author's Affiliation Faculty of Science and Technology, Meijo University
5th Author's Name Hiroshi Amano
5th Author's Affiliation Faculty of Science and Technology, Meijo University
6th Author's Name Isamu Akasaki
6th Author's Affiliation Faculty of Science and Technology, Meijo University
Date 2008-05-16
Paper # ED2008-13,CPM2008-21,SDM2008-33
Volume (vol) vol.108
Number (no) 35
Page pp.pp.-
#Pages 5
Date of Issue