| Presentation | 2008-04-23 Influence of Untestable Hard Error on Soft Error Hardened Latches Kengo NAKASHIMA, Kazuteru NAMBA, Hideo ITO, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In recent high-density, high-speed and low-power VLSIs, soft errors frequently occur, and soft error hardened design becomes essential. Soft error hardened latches were proposed as one of techniques correcting soft errors occurring on latches in VLSI systems. Some manufacturing faults occurring on the soft error hardened latches are untestable. Even if such faults occur, the latches work correctly as long as no soft errors occur. However, the faulty latches may have only lower soft error correcting copability than fault-free latches. This paper provides an analysis of soft error correcting capability of soft error hardened latches that untestable manufacturing open and short faults occur. On soft error hardened latches that open and short fault occur, uncorrectable soft errors occur 8.663×10^<-17> and 9.789×10^<-17>times per an hour, respectively. The probability that uncorrectable soft errors occur on faulty circuits with soft error hardened latches is 10^<-4>～10^<-5>times lower than one that softerrors occur on fault-free circuits without soft error hardened latches. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Soft Error / Latch / Soft Error Rate / Open Fault / Short Fault |
| Paper # | CPSY2008-8,DC2008-8 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2008/4/16(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Influence of Untestable Hard Error on Soft Error Hardened Latches |
| Sub Title (in English) | |
| Keyword(1) | Soft Error |
| Keyword(2) | Latch |
| Keyword(3) | Soft Error Rate |
| Keyword(4) | Open Fault |
| Keyword(5) | Short Fault |
| 1st Author's Name | Kengo NAKASHIMA |
| 1st Author's Affiliation | Graduate School of Advanced Integration Science, Chiba University() |
| 2nd Author's Name | Kazuteru NAMBA |
| 2nd Author's Affiliation | Graduate School of Advanced Integration Science, Chiba University |
| 3rd Author's Name | Hideo ITO |
| 3rd Author's Affiliation | Graduate School of Advanced Integration Science, Chiba University |
| Date | 2008-04-23 |
| Paper # | CPSY2008-8,DC2008-8 |
| Volume (vol) | vol.108 |
| Number (no) | 15 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |