| Presentation | 2008-04-23 Current Status of Impacts and Countermeasures in Environmental Neutron Induced Failures in Electric Systems : Evolution of Multi-Node Upset Issues Eishi Ibe, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in semiconductor devices from late 90s. International defacto- or dejule standards are being established to fix standard test methods to quantify the vulnerability of the semiconductor devices to such radiation sources. The present paper summarizes the current status of the error modes, experimental and simulation/analysis methods, and possible/existing countermeasures. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | neutron / soft-error / SEFI / MCU / MCBI / Multi-Node Upset |
| Paper # | CPSY2008-7,DC2008-7 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2008/4/16(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Current Status of Impacts and Countermeasures in Environmental Neutron Induced Failures in Electric Systems : Evolution of Multi-Node Upset Issues |
| Sub Title (in English) | |
| Keyword(1) | neutron |
| Keyword(2) | soft-error |
| Keyword(3) | SEFI |
| Keyword(4) | MCU |
| Keyword(5) | MCBI |
| Keyword(6) | Multi-Node Upset |
| 1st Author's Name | Eishi Ibe |
| 1st Author's Affiliation | Production Engineering Research Laboratory, Hitachi, Ltd.() |
| Date | 2008-04-23 |
| Paper # | CPSY2008-7,DC2008-7 |
| Volume (vol) | vol.108 |
| Number (no) | 15 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |