Presentation 2008-04-12
Formation of Polycrystalline Si Thin Films Using Nanocrystalline Ge Nuclei
Chiaki YOSHIMOTO, Hiromasa OHMI, Takayoshi SHIMURA, Hiroaki KAKIUCHI, Heiji WATANABE, Kiyoshi YASUTAKE,
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Abstract(in English) Large-grained poly-Si thin films are needed for the fabrication of high-performance thin film transistors (TFTs). We have proposed a method to form large-grained poly-Si thin films using nanocrystalline Ge nuclei on glass substrates. Ge nuclei are fabricated by a combination of the solid-phase crystallization (SPC) of a-Ge and the oxygen etching for controlling their size and density. Using this method, a remarkable reduction of crystallization time for a-Si films has been achieved. In this study, we have investigated the crystallization process of a-Si films with Ge nuclei using Raman spectroscopy. It was found that the activation energy for crystallization varies depending on the deposition method of a-Si films. Fourier transform infrared spectroscopy (FTIR) and thermal desorption spectroscopy (TDS) measurements revealed that the crystallization is accelerated when a-Si layer contains a large number of Si-H bonds.
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Keyword(in English) poly-Si / nanocrystalline Ge / solid phase crystallization / large grain
Paper # SDM2008-18,OME2008-18
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Conference Information
Committee OME
Conference Date 2008/4/4(1days)
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Paper Information
Registration To Organic Material Electronics (OME)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Formation of Polycrystalline Si Thin Films Using Nanocrystalline Ge Nuclei
Sub Title (in English)
Keyword(1) poly-Si
Keyword(2) nanocrystalline Ge
Keyword(3) solid phase crystallization
Keyword(4) large grain
1st Author's Name Chiaki YOSHIMOTO
1st Author's Affiliation Graduate School of Engineering, Osaka University()
2nd Author's Name Hiromasa OHMI
2nd Author's Affiliation Graduate School of Engineering, Osaka University
3rd Author's Name Takayoshi SHIMURA
3rd Author's Affiliation Graduate School of Engineering, Osaka University
4th Author's Name Hiroaki KAKIUCHI
4th Author's Affiliation Graduate School of Engineering, Osaka University
5th Author's Name Heiji WATANABE
5th Author's Affiliation Graduate School of Engineering, Osaka University
6th Author's Name Kiyoshi YASUTAKE
6th Author's Affiliation Graduate School of Engineering, Osaka University
Date 2008-04-12
Paper # SDM2008-18,OME2008-18
Volume (vol) vol.108
Number (no) 2
Page pp.pp.-
#Pages 5
Date of Issue