Presentation 2008-03-10
Reconstructing Attribute Dependencies and its Interpretation in Classification Problems : Experimental Results on Modeling Probabilistic Dependencies with Bayesian Network Classifiers
Ken Ueno, Youichi Kitahara, Topon K. Paul, Ryohei Orihara,
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Abstract(in English) Recently, many researchers have been focusing on Bayesian Network Classifiers (BNC) as classifiers which can consider dependencies between attributes. In this paper we propose new methods called k-Bayesian Network Classifier 1 (k-BNC1), and k-BNC2 to reconstruct the attribute-dependencies from data, which is based on the conditional mutual information criteria, and the standardized Kullback-Leibler divergence measure, respectively. We compared these classification performances with the performance by the naive Bayes classifier as well as K2 algorithm and Hill Climbing Search algorithm, both of which can automatically construct Bayesian Network structures from data. We also discuss the interpretation of the model generated by our proposed methods, and the advantage of the constraint on directions of arcs between two attributes. Our experimental results show the tendency that k-BNC1 and k-BNC2 perform better than the other methods. The results also suggest that the model with the direction constraints make the classification performance better than the one without the constraints.
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Keyword(in English) Bayesian Network Classifiers / Attribute Dependency
Paper # KBSE2007-59
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Committee KBSE
Conference Date 2008/3/3(1days)
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Registration To Knowledge-Based Software Engineering (KBSE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Reconstructing Attribute Dependencies and its Interpretation in Classification Problems : Experimental Results on Modeling Probabilistic Dependencies with Bayesian Network Classifiers
Sub Title (in English)
Keyword(1) Bayesian Network Classifiers
Keyword(2) Attribute Dependency
1st Author's Name Ken Ueno
1st Author's Affiliation System Engineering Laboratory, Corporate Research and Development Center, Toshiba Corporation()
2nd Author's Name Youichi Kitahara
2nd Author's Affiliation System Engineering Laboratory, Corporate Research and Development Center, Toshiba Corporation
3rd Author's Name Topon K. Paul
3rd Author's Affiliation System Engineering Laboratory, Corporate Research and Development Center, Toshiba Corporation
4th Author's Name Ryohei Orihara
4th Author's Affiliation System Engineering Laboratory, Corporate Research and Development Center, Toshiba Corporation
Date 2008-03-10
Paper # KBSE2007-59
Volume (vol) vol.107
Number (no) 540
Page pp.pp.-
#Pages 6
Date of Issue