Presentation | 2008/3/20 A Functional Unit with Small Variety of Highly Reliable Cells and Its Evaluation Kazunori SUZUKI, Takashi NAKADA, Masaki NAKANISHI, Shigeru YAMASHITA, Yasuhiko NAKASHIMA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Recently, the shrinking process causes growth of error rate. We have proposed new standard cells in which transistors are arranged regularly in order to reduce errors. These cells are composed of pairs of PMOS and NMOS. The proposed cells are more robust against transistor faults and can also detect them. In this paper, we propose and evaluate a functional unit that is composed of the proposed cells. The number of transistors in our proposed functional unit is comparable that by traditional cells. Moreover our proposed functional unit has better fault tolerance. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | transistor variation / fault detection / fault tolerantce |
Paper # | CPSY2007-108,DC2007-112 |
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Committee | CPSY |
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Conference Date | 2008/3/20(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Computer Systems (CPSY) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Functional Unit with Small Variety of Highly Reliable Cells and Its Evaluation |
Sub Title (in English) | |
Keyword(1) | transistor variation |
Keyword(2) | fault detection |
Keyword(3) | fault tolerantce |
1st Author's Name | Kazunori SUZUKI |
1st Author's Affiliation | Nara Institute of Science and Technology() |
2nd Author's Name | Takashi NAKADA |
2nd Author's Affiliation | Nara Institute of Science and Technology |
3rd Author's Name | Masaki NAKANISHI |
3rd Author's Affiliation | Nara Institute of Science and Technology |
4th Author's Name | Shigeru YAMASHITA |
4th Author's Affiliation | Nara Institute of Science and Technology |
5th Author's Name | Yasuhiko NAKASHIMA |
5th Author's Affiliation | Nara Institute of Science and Technology |
Date | 2008/3/20 |
Paper # | CPSY2007-108,DC2007-112 |
Volume (vol) | vol.107 |
Number (no) | 558 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |