| Presentation | 2008/3/20 Code Quality Analysis Toolset for Embedded Systems by using Eclipse Yuichi Nakamura, Kouhei Nadehara, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Recently, the development term of embedded systems is increasing, since the embedded systems are going to be complicated. The reason of increasing is not the coding phase but the function, performance or quality evaluation. However, an evaluation system of embedded systems is very poor, because they has the minimum systems for their primary functions. In this paper, we propose a code quality analysis tool for embedded systems. The proposed system consists of "stub" in embedded systems and the control PC. The PC controls stub to apply the code quality system and to obtain the results of analysis. The PC is implemented "Eclipse" for effective control and rich GUI. In evaluation, the systems which is "valgrind", memory management system and "gcov" coverage tool are applied in the embedded system and PC can visualize the analysis results via our proposed stub. We realize the useful code quality systems in embedded system like as enterprise systems. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Embedded System / Code quality analysis / Eclipse |
| Paper # | CPSY2007-104,DC2007-108 |
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| Conference Information | |
| Committee | CPSY |
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| Conference Date | 2008/3/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Paper Information | |
| Registration To | Computer Systems (CPSY) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Code Quality Analysis Toolset for Embedded Systems by using Eclipse |
| Sub Title (in English) | |
| Keyword(1) | Embedded System |
| Keyword(2) | Code quality analysis |
| Keyword(3) | Eclipse |
| 1st Author's Name | Yuichi Nakamura |
| 1st Author's Affiliation | System IP Core Laboratories, NEC Corp.() |
| 2nd Author's Name | Kouhei Nadehara |
| 2nd Author's Affiliation | System IP Core Laboratories, NEC Corp. |
| Date | 2008/3/20 |
| Paper # | CPSY2007-104,DC2007-108 |
| Volume (vol) | vol.107 |
| Number (no) | 558 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |