Presentation 2008-01-17
Fault tolerance analysis for holographic memories in optically reconfigurable gate arrays.
Koji SHINOHARA, Minoru WATANABE,
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Abstract(in English) Recently, optically reconfigurable gate arrays (ORGAs) that enable high information processing speed are being developed. Such optically reconfigurable gate arrays consist of a laser diode array, a holographic memory, and a gate array VLSI, allowing fast reconfigurations and numerous reconfiguration contexts. Since an ORGA-VLSI can be programmed optically and in perfectly parallel, even if its gate array includes defect portions, the gate array can be used by avoiding such defect portions and by programming the same circuit to the other area. However, it is required that a holographic memory to support such programming must be dependable. So, this paper clarifies noise tolerance properties of holographic configurations.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Optically reconfigurable gate array / FPGA / holographic memory / Liquid crystal / Impulse noise / Gauss noise
Paper # VLD2007-127,CPSY2007-70,RECONF2007-73
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Committee RECONF
Conference Date 2008/1/10(1days)
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Registration To Reconfigurable Systems (RECONF)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Fault tolerance analysis for holographic memories in optically reconfigurable gate arrays.
Sub Title (in English)
Keyword(1) Optically reconfigurable gate array
Keyword(2) FPGA
Keyword(3) holographic memory
Keyword(4) Liquid crystal
Keyword(5) Impulse noise
Keyword(6) Gauss noise
1st Author's Name Koji SHINOHARA
1st Author's Affiliation Shizuoka University()
2nd Author's Name Minoru WATANABE
2nd Author's Affiliation Shizuoka University
Date 2008-01-17
Paper # VLD2007-127,CPSY2007-70,RECONF2007-73
Volume (vol) vol.107
Number (no) 419
Page pp.pp.-
#Pages 5
Date of Issue