Presentation 2008-01-11
Electrical potential mapping of self-aligned organic nano-FETs by AFM potentiometry
Akinobu SAITO, Masatoshi SAKAI, Masaaki IIZUKA, Masakazu NAKAMURA, Kazuhiro KUDO,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The distribution of electrical potential and the corresponding local topographic image of the self-aligned organic conductive wires and nano field-effect transistors were measured with the novel method of atomic force microscope potentiometry. The specific growth scheme of organic conductive wires with respect to the metal edge was clearly observed and also discussed.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) charge transfer complex / organic conductor / crystal growth under an electric field / nano-FET / AFM potentiometry
Paper # OME2007-71
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Conference Information
Committee OME
Conference Date 2008/1/4(1days)
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Paper Information
Registration To Organic Material Electronics (OME)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Electrical potential mapping of self-aligned organic nano-FETs by AFM potentiometry
Sub Title (in English)
Keyword(1) charge transfer complex
Keyword(2) organic conductor
Keyword(3) crystal growth under an electric field
Keyword(4) nano-FET
Keyword(5) AFM potentiometry
1st Author's Name Akinobu SAITO
1st Author's Affiliation Department of Electrical and Mechanical Engineering, Chiba University()
2nd Author's Name Masatoshi SAKAI
2nd Author's Affiliation Department of Electrical and Mechanical Engineering, Chiba University
3rd Author's Name Masaaki IIZUKA
3rd Author's Affiliation Department of Electrical and Mechanical Engineering, Chiba University
4th Author's Name Masakazu NAKAMURA
4th Author's Affiliation Department of Electrical and Mechanical Engineering, Chiba University
5th Author's Name Kazuhiro KUDO
5th Author's Affiliation Department of Electrical and Mechanical Engineering, Chiba University
Date 2008-01-11
Paper # OME2007-71
Volume (vol) vol.107
Number (no) 412
Page pp.pp.-
#Pages 6
Date of Issue