| Presentation | 2008-01-18 A Method for Measuring Vref Noise Tolerance of DDR2-SDRAM on Test Board That Simulates an Actual Memory Module Yutaka UEMATSU, Hideki OSAKA, Yoji NISHIO, Susumu HATANO, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Aiming to achieve double data rate-synchronous DRAM (DDR-SDRAM) at low-cost and with high noise tolerance by setting adequate Vref target impedance, we have inserted a low pass filter (LPF) in the Vref line of DRAM chip. To demonstrate this LPF effect, we have established a measurement setup for Vref noise tolerance of DDR2-SDRAM on test board simulating actual memory module. The measured Vref noise tolerance has strong frequency-dependency; the higher the frequency, the larger the noise tolerance. We believe that this is because of the LPF consisted in the test chip. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | DDR-SDRAM / Vref / Noise Tolerance / Noise Sensitivity Measurement / Target Impedance |
| Paper # | CPM2007-139,ICD2007-150 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2008/1/10(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Method for Measuring Vref Noise Tolerance of DDR2-SDRAM on Test Board That Simulates an Actual Memory Module |
| Sub Title (in English) | |
| Keyword(1) | DDR-SDRAM |
| Keyword(2) | Vref |
| Keyword(3) | Noise Tolerance |
| Keyword(4) | Noise Sensitivity Measurement |
| Keyword(5) | Target Impedance |
| 1st Author's Name | Yutaka UEMATSU |
| 1st Author's Affiliation | Central Research Laboratory, Hitachi, Ltd.() |
| 2nd Author's Name | Hideki OSAKA |
| 2nd Author's Affiliation | Central Research Laboratory, Hitachi, Ltd. |
| 3rd Author's Name | Yoji NISHIO |
| 3rd Author's Affiliation | Elpida Memory, Inc. |
| 4th Author's Name | Susumu HATANO |
| 4th Author's Affiliation | Elpida Memory, Inc. |
| Date | 2008-01-18 |
| Paper # | CPM2007-139,ICD2007-150 |
| Volume (vol) | vol.107 |
| Number (no) | 426 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |