Presentation	2008-01-17 In-situ measurement of supply-noise maps with millivolt accuracy and nanosecond-order time resolution Yusuke KANNO, Yuki KONDOH, Takahiro IRITA, Kenji HIROSE, Ryo MORI, Yoshihiko YASU, Shigenobu KOMATSU, Hiroyuki MIZUNO,
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Abstract(in English)	An in-situ measurement scheme for generating supply-noise maps, which can be conducted while running applications in product-level LSIs, was developed. The design of the on-chip voltage sampling probe is based on a simple ring oscillator, which converts local supply difference between V_ and V_ to oscillation-frequency deviation. High measurement accuracy is achieved by off-chip digital signal processing and calibration. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution I a 3G-cellular-phone processor. It will thus help in designing power-supply networks and in visually verifying the quality of a power supply.
Keyword(in Japanese)	(See Japanese page)
Keyword(in English)	in-situ measurement / supply-noise maps / on-chip voltage sampling probe / ring oscillator / off-chip digital signal processing / calibration
Paper #	CPM2007-136,ICD2007-147
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Conference Information
Committee	ICD
Conference Date	2008/1/10(1days)
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Paper Information
Registration To	Integrated Circuits and Devices (ICD)
Language	JPN
Title (in Japanese)	(See Japanese page)
Sub Title (in Japanese)	(See Japanese page)
Title (in English)	In-situ measurement of supply-noise maps with millivolt accuracy and nanosecond-order time resolution
Sub Title (in English)
Keyword(1)	in-situ measurement
Keyword(2)	supply-noise maps
Keyword(3)	on-chip voltage sampling probe
Keyword(4)	ring oscillator
Keyword(5)	off-chip digital signal processing
Keyword(6)	calibration
1st Author's Name	Yusuke KANNO
1st Author's Affiliation	Central Research Laboratory, Hitachi, Ltd.()
2nd Author's Name	Yuki KONDOH
2nd Author's Affiliation	Central Research Laboratory, Hitachi, Ltd.
3rd Author's Name	Takahiro IRITA
3rd Author's Affiliation	Renesas Technology, Corp.
4th Author's Name	Kenji HIROSE
4th Author's Affiliation	Renesas Technology, Corp.
5th Author's Name	Ryo MORI
5th Author's Affiliation	Renesas Technology, Corp.
6th Author's Name	Yoshihiko YASU
6th Author's Affiliation	Renesas Technology, Corp.
7th Author's Name	Shigenobu KOMATSU
7th Author's Affiliation	Central Research Laboratory, Hitachi, Ltd.
8th Author's Name	Hiroyuki MIZUNO
8th Author's Affiliation	Central Research Laboratory, Hitachi, Ltd.
Date	2008-01-17
Paper #	CPM2007-136,ICD2007-147
Volume (vol)	vol.107
Number (no)	426
Page	pp.pp.-
#Pages	6
Date of Issue