| Presentation | 2008-01-17 Integrated evaluation of on-chip power supply noise and off-chip electromagnetic noise of digital LSI Yuki TAKAHASHI, Kouji ICHIKAWA, Makoto NAGATA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Power Supply noise waveform are acquired in a voltage domain by on-chip monitor at resolution of 0.3ns / 1.2mV, in a digital test circuit consisting of 0.18μm CMOS standard logic cells. Concurrently magnetic field variation on a printed circuit board (PCB) due to power supply current of the test circuit is measured by an off-chip magnetic probing technique. An equivalent circuit model that unifies on- and off- chip impedance network of the entire test setup for EMI analysis is used for calculating the on-chip voltage-mode power supply noise from the off-chip magnetic field measurements. We have confirmed exellent consistency in frequency components of power supply noise up to 300MHz among those derived by the on-chip direct sensing and the off-chip magnetic probing techniques. These results not only validate thee state-of-the art EMI analysis methodology but also promise its connectivity with on-chip power supply integrity analysis at the integrated circuit level, for the first time in both technical fields. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | large scale integration / electro magnetic interference / printed circuit board / signal integrity / power supply integrity / integrated analysis |
| Paper # | CPM2007-129,ICD2007-140 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2008/1/10(1days) |
| Place (in Japanese) | (See Japanese page) |
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| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Integrated evaluation of on-chip power supply noise and off-chip electromagnetic noise of digital LSI |
| Sub Title (in English) | |
| Keyword(1) | large scale integration |
| Keyword(2) | electro magnetic interference |
| Keyword(3) | printed circuit board |
| Keyword(4) | signal integrity |
| Keyword(5) | power supply integrity |
| Keyword(6) | integrated analysis |
| 1st Author's Name | Yuki TAKAHASHI |
| 1st Author's Affiliation | Graduate School of Science and Technology, Kobe University() |
| 2nd Author's Name | Kouji ICHIKAWA |
| 2nd Author's Affiliation | DENSO Co., Ltd. |
| 3rd Author's Name | Makoto NAGATA |
| 3rd Author's Affiliation | Department of Computer and Systems Engineering, Kobe University |
| Date | 2008-01-17 |
| Paper # | CPM2007-129,ICD2007-140 |
| Volume (vol) | vol.107 |
| Number (no) | 426 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |