Presentation 2008-01-25
An evaluation of the measurement method for Fully Anechoic Room
Hiroyoshi TAGI, Yoshiyuki SAITO, Yukihiro FUKUMOTO, Takuya NAKAMORI, Masataka INOUE, Katsuo ISHIHARA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) According to the current standards of EMC, the radiated emission level is measured as the electric field strength of synthesized-vector-wave. The wave is composed of the direct wave from equipment under test (EUT) and the reflected wave from the floor. On the other hand, it is being discussed to use a fully anechoic room (FAR) in a new EMC standard: CISPR 32. In a FAR, the variation of the height pattern occurs little because there is no reflected wave from the floor. Therefore, the measurement time can be reduced drastically, since the height of the antenna does not need to be changed. However, there is a concern that an accurate peak value cannot be obtained at the fixed-height antenna, since an EUT may have an directional characteristics. In this report, we evaluated the relation between the height of the antenna and the measurement result by using a comb generator and some digital consumer electronics equipments. As a result, we verified that there was no problem in this evaluation method even if the height of the antenna is fixed. Additionally, it was shown that we could shorten the measurement time to about one sixth of the conventional method, by fixed-height antenna in the FAR.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Anechoic room / FAR / OATS / SAC / EMI / CISPR
Paper # EMCJ2007-111
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Conference Information
Committee EMCJ
Conference Date 2008/1/18(1days)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) An evaluation of the measurement method for Fully Anechoic Room
Sub Title (in English)
Keyword(1) Anechoic room
Keyword(2) FAR
Keyword(3) OATS
Keyword(4) SAC
Keyword(5) EMI
Keyword(6) CISPR
1st Author's Name Hiroyoshi TAGI
1st Author's Affiliation System Engineering Center, Matsushita Electric Industrial Co., Ltd()
2nd Author's Name Yoshiyuki SAITO
2nd Author's Affiliation System Engineering Center, Matsushita Electric Industrial Co., Ltd
3rd Author's Name Yukihiro FUKUMOTO
3rd Author's Affiliation System Engineering Center, Matsushita Electric Industrial Co., Ltd
4th Author's Name Takuya NAKAMORI
4th Author's Affiliation Corporate Manufacturing Innovation Division, MEI
5th Author's Name Masataka INOUE
5th Author's Affiliation Corporate Manufacturing Innovation Division, MEI
6th Author's Name Katsuo ISHIHARA
6th Author's Affiliation Corporate Manufacturing Innovation Division, MEI
Date 2008-01-25
Paper # EMCJ2007-111
Volume (vol) vol.107
Number (no) 456
Page pp.pp.-
#Pages 6
Date of Issue